Karl Janson, René Pihlak, Siavoosh Payandeh Azad, Behrad Niazmand, G. Jervan, J. Raik
{"title":"利用循环输入缓冲区的固有冗余处理NoC链路上的集合","authors":"Karl Janson, René Pihlak, Siavoosh Payandeh Azad, Behrad Niazmand, G. Jervan, J. Raik","doi":"10.1109/BEC.2018.8600989","DOIUrl":null,"url":null,"abstract":"The miniaturization of nanometer technologies beyond the sub-micron domain has jeopardized the reliability of on-chip network links, making them more susceptible to Single Event Transients (SETs) during system’s run-time. Using retransmission approaches has been proposed in the literature for handling SETs in Network-on-Chip (NoC) links. However, those approaches either suffer from significant latency overhead or impose additional retransmission buffers, which consume more area. This paper proposes the ReUSE mechanism as a transient fault mitigation mechanism for Network-on-Chip links. The mechanism takes advantage of the inherent redundancy in the input buffers of NoC routers and reuses these for SET mitigation on the NoC links. By using a parity checker for fault detection, the approach can cover all SETs during run-time and return to normal operation in maximum one clock cycle after the disappearance of the fault. The experimental results show that the proposed mechanism prevents network-wide failure even in harsh environments with up to 80 million random faults on links per second. The ReUSE mechanism imposes 18% area overhead and 7.8% critical path delay overhead to the baseline NoC router.","PeriodicalId":140384,"journal":{"name":"2018 16th Biennial Baltic Electronics Conference (BEC)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Handling of SETs on NoC Links by Exploitation of Inherent Redundancy in Circular Input Buffers\",\"authors\":\"Karl Janson, René Pihlak, Siavoosh Payandeh Azad, Behrad Niazmand, G. Jervan, J. Raik\",\"doi\":\"10.1109/BEC.2018.8600989\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The miniaturization of nanometer technologies beyond the sub-micron domain has jeopardized the reliability of on-chip network links, making them more susceptible to Single Event Transients (SETs) during system’s run-time. Using retransmission approaches has been proposed in the literature for handling SETs in Network-on-Chip (NoC) links. However, those approaches either suffer from significant latency overhead or impose additional retransmission buffers, which consume more area. This paper proposes the ReUSE mechanism as a transient fault mitigation mechanism for Network-on-Chip links. The mechanism takes advantage of the inherent redundancy in the input buffers of NoC routers and reuses these for SET mitigation on the NoC links. By using a parity checker for fault detection, the approach can cover all SETs during run-time and return to normal operation in maximum one clock cycle after the disappearance of the fault. The experimental results show that the proposed mechanism prevents network-wide failure even in harsh environments with up to 80 million random faults on links per second. The ReUSE mechanism imposes 18% area overhead and 7.8% critical path delay overhead to the baseline NoC router.\",\"PeriodicalId\":140384,\"journal\":{\"name\":\"2018 16th Biennial Baltic Electronics Conference (BEC)\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 16th Biennial Baltic Electronics Conference (BEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/BEC.2018.8600989\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 16th Biennial Baltic Electronics Conference (BEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BEC.2018.8600989","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Handling of SETs on NoC Links by Exploitation of Inherent Redundancy in Circular Input Buffers
The miniaturization of nanometer technologies beyond the sub-micron domain has jeopardized the reliability of on-chip network links, making them more susceptible to Single Event Transients (SETs) during system’s run-time. Using retransmission approaches has been proposed in the literature for handling SETs in Network-on-Chip (NoC) links. However, those approaches either suffer from significant latency overhead or impose additional retransmission buffers, which consume more area. This paper proposes the ReUSE mechanism as a transient fault mitigation mechanism for Network-on-Chip links. The mechanism takes advantage of the inherent redundancy in the input buffers of NoC routers and reuses these for SET mitigation on the NoC links. By using a parity checker for fault detection, the approach can cover all SETs during run-time and return to normal operation in maximum one clock cycle after the disappearance of the fault. The experimental results show that the proposed mechanism prevents network-wide failure even in harsh environments with up to 80 million random faults on links per second. The ReUSE mechanism imposes 18% area overhead and 7.8% critical path delay overhead to the baseline NoC router.