S. Carlo, Salvatore Galfano, Marco Indaco, P. Prinetto
{"title":"Ef3S:基于闪存系统的评估框架","authors":"S. Carlo, Salvatore Galfano, Marco Indaco, P. Prinetto","doi":"10.1109/IOLTS.2013.6604079","DOIUrl":null,"url":null,"abstract":"NAND Flash memories are gaining popularity in the development of electronic embedded systems for both consumer and mission-critical applications. NAND Flashes crucially influence computing systems development and performances. EF3S, a framework to easily assess NAND Flash based memory systems performances (reliability, throughput, power), is presented. The framework is based on a simulation engine and a running environment which enable developers to assess any application impact. Experimental results show functionality of the framework, analysing several performance-reliability tradeoffs of an illustrative system.","PeriodicalId":423175,"journal":{"name":"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Ef3S: An evaluation framework for flash-based systems\",\"authors\":\"S. Carlo, Salvatore Galfano, Marco Indaco, P. Prinetto\",\"doi\":\"10.1109/IOLTS.2013.6604079\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"NAND Flash memories are gaining popularity in the development of electronic embedded systems for both consumer and mission-critical applications. NAND Flashes crucially influence computing systems development and performances. EF3S, a framework to easily assess NAND Flash based memory systems performances (reliability, throughput, power), is presented. The framework is based on a simulation engine and a running environment which enable developers to assess any application impact. Experimental results show functionality of the framework, analysing several performance-reliability tradeoffs of an illustrative system.\",\"PeriodicalId\":423175,\"journal\":{\"name\":\"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-07-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IOLTS.2013.6604079\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2013.6604079","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Ef3S: An evaluation framework for flash-based systems
NAND Flash memories are gaining popularity in the development of electronic embedded systems for both consumer and mission-critical applications. NAND Flashes crucially influence computing systems development and performances. EF3S, a framework to easily assess NAND Flash based memory systems performances (reliability, throughput, power), is presented. The framework is based on a simulation engine and a running environment which enable developers to assess any application impact. Experimental results show functionality of the framework, analysing several performance-reliability tradeoffs of an illustrative system.
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