{"title":"环氧树脂封装陶瓷四平面包装","authors":"T. Carden, J. Clementi, S. Engle","doi":"10.1109/ECTC.1994.367617","DOIUrl":null,"url":null,"abstract":"The Ceramic Quad Flat Pack (CQFP) is a high performance, low cost technology for surface mount applications. It is an extension of the Metallized Ceramic (MC) and Metallized Ceramic with Polyimide (MCP) product base. These finished modules conform to JEDEC I/O and footprint standards. The packages are available in 0.5 mm and 0.4 mm lead pitches with flexibility to address unique application requirements such as body sizes or lead counts/pitches. Semiconductor die interconnection is performed using either flip chip (C4-Controlled Collapse Chip Connection) attach or wirebonding. Excellent package reliability with no intrinsic wear out failure mechanism results by encapsulating solder joints from the silicon C4 die and peripheral lead to ceramic carrier. IBM evaluated several encapsulant configurations, and tested over 2000 encapsulated carriers and 897000 individual solder joints during development and qualification. Epoxy encapsulation of solder joint connections on CQFP's has been successfully implemented in production across several IBM manufacturing sites. This enhancement eliminates any intrinsic failure mechanism associated with fatigue wear out. It is a significant extension of a low cost and high reliability product technology.<<ETX>>","PeriodicalId":344532,"journal":{"name":"1994 Proceedings. 44th Electronic Components and Technology Conference","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Epoxy encapsulation on Ceramic Quad Flat Packs\",\"authors\":\"T. Carden, J. Clementi, S. Engle\",\"doi\":\"10.1109/ECTC.1994.367617\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The Ceramic Quad Flat Pack (CQFP) is a high performance, low cost technology for surface mount applications. It is an extension of the Metallized Ceramic (MC) and Metallized Ceramic with Polyimide (MCP) product base. These finished modules conform to JEDEC I/O and footprint standards. The packages are available in 0.5 mm and 0.4 mm lead pitches with flexibility to address unique application requirements such as body sizes or lead counts/pitches. Semiconductor die interconnection is performed using either flip chip (C4-Controlled Collapse Chip Connection) attach or wirebonding. Excellent package reliability with no intrinsic wear out failure mechanism results by encapsulating solder joints from the silicon C4 die and peripheral lead to ceramic carrier. IBM evaluated several encapsulant configurations, and tested over 2000 encapsulated carriers and 897000 individual solder joints during development and qualification. Epoxy encapsulation of solder joint connections on CQFP's has been successfully implemented in production across several IBM manufacturing sites. This enhancement eliminates any intrinsic failure mechanism associated with fatigue wear out. It is a significant extension of a low cost and high reliability product technology.<<ETX>>\",\"PeriodicalId\":344532,\"journal\":{\"name\":\"1994 Proceedings. 44th Electronic Components and Technology Conference\",\"volume\":\"33 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1994 Proceedings. 44th Electronic Components and Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.1994.367617\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1994 Proceedings. 44th Electronic Components and Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1994.367617","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The Ceramic Quad Flat Pack (CQFP) is a high performance, low cost technology for surface mount applications. It is an extension of the Metallized Ceramic (MC) and Metallized Ceramic with Polyimide (MCP) product base. These finished modules conform to JEDEC I/O and footprint standards. The packages are available in 0.5 mm and 0.4 mm lead pitches with flexibility to address unique application requirements such as body sizes or lead counts/pitches. Semiconductor die interconnection is performed using either flip chip (C4-Controlled Collapse Chip Connection) attach or wirebonding. Excellent package reliability with no intrinsic wear out failure mechanism results by encapsulating solder joints from the silicon C4 die and peripheral lead to ceramic carrier. IBM evaluated several encapsulant configurations, and tested over 2000 encapsulated carriers and 897000 individual solder joints during development and qualification. Epoxy encapsulation of solder joint connections on CQFP's has been successfully implemented in production across several IBM manufacturing sites. This enhancement eliminates any intrinsic failure mechanism associated with fatigue wear out. It is a significant extension of a low cost and high reliability product technology.<>
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