Lianjun Liu, M. Lagouge, Bob Steimle, A. Geisberger, J. McKillop, D. Monk
{"title":"UMEMS:优质汽车惯性传感器制造的强大技术平台","authors":"Lianjun Liu, M. Lagouge, Bob Steimle, A. Geisberger, J. McKillop, D. Monk","doi":"10.1109/INERTIAL56358.2023.10103951","DOIUrl":null,"url":null,"abstract":"A new MEMS technology platform, UMEMS, has been developed and released for automotive inertial sensors manufacturing. Several features, including 1) single crystal Silicon MEMS proof mass, 2) polysilicon Through-Si-Via (TSV), 3) AlGe eutectic wafer bonding, and 4) metal redistribution layer (RDL) routing, have been employed in UMEMS to improve reproducibility, reliability, flexibility and reduce cost. The single crystal Silicon proof mass has minimal internal stress. AlGe bonding serves the dual function of 1) electrically connecting TSV in the cap wafer and the silicon electrodes/interconnects in the device wafer, and 2) hermetically sealing the MEMS cavity from external environment. The TSV and RDL allow great design flexibility and re-use for large automotive product families. We also introduced a quality methodology called Above-and-Beyond ($A$aB) in the development and product introduction, which enables UMEMS to be released in volume manufacturing with sub-lppm defectivity at early phase of production.","PeriodicalId":236326,"journal":{"name":"2023 IEEE International Symposium on Inertial Sensors and Systems (INERTIAL)","volume":"107 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"UMEMS: A Robust Technology Platform For Quality Automotive Inertial Sensor Manufacturing\",\"authors\":\"Lianjun Liu, M. Lagouge, Bob Steimle, A. Geisberger, J. McKillop, D. Monk\",\"doi\":\"10.1109/INERTIAL56358.2023.10103951\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new MEMS technology platform, UMEMS, has been developed and released for automotive inertial sensors manufacturing. Several features, including 1) single crystal Silicon MEMS proof mass, 2) polysilicon Through-Si-Via (TSV), 3) AlGe eutectic wafer bonding, and 4) metal redistribution layer (RDL) routing, have been employed in UMEMS to improve reproducibility, reliability, flexibility and reduce cost. The single crystal Silicon proof mass has minimal internal stress. AlGe bonding serves the dual function of 1) electrically connecting TSV in the cap wafer and the silicon electrodes/interconnects in the device wafer, and 2) hermetically sealing the MEMS cavity from external environment. The TSV and RDL allow great design flexibility and re-use for large automotive product families. We also introduced a quality methodology called Above-and-Beyond ($A$aB) in the development and product introduction, which enables UMEMS to be released in volume manufacturing with sub-lppm defectivity at early phase of production.\",\"PeriodicalId\":236326,\"journal\":{\"name\":\"2023 IEEE International Symposium on Inertial Sensors and Systems (INERTIAL)\",\"volume\":\"107 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-03-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 IEEE International Symposium on Inertial Sensors and Systems (INERTIAL)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/INERTIAL56358.2023.10103951\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE International Symposium on Inertial Sensors and Systems (INERTIAL)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INERTIAL56358.2023.10103951","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
针对汽车惯性传感器的制造,开发并发布了一种新的MEMS技术平台——UMEMS。包括1)单晶硅MEMS证明质量,2)多晶硅通过si - via (TSV), 3) AlGe共晶晶片键合以及4)金属再分布层(RDL)路由在内的几个特性已被用于UMEMS中,以提高再现性,可靠性,灵活性和降低成本。单晶硅防质量具有最小的内应力。ge键合具有两个功能:1)将帽晶圆中的TSV与器件晶圆中的硅电极/互连电连接;2)将MEMS腔与外部环境密封。TSV和RDL为大型汽车产品系列提供了很大的设计灵活性和重用性。我们还在开发和产品引入中引入了一种称为“超越”的质量方法($ a $aB),这使得UMEMS能够在生产早期阶段以低于lppm的缺陷量进行批量生产。
UMEMS: A Robust Technology Platform For Quality Automotive Inertial Sensor Manufacturing
A new MEMS technology platform, UMEMS, has been developed and released for automotive inertial sensors manufacturing. Several features, including 1) single crystal Silicon MEMS proof mass, 2) polysilicon Through-Si-Via (TSV), 3) AlGe eutectic wafer bonding, and 4) metal redistribution layer (RDL) routing, have been employed in UMEMS to improve reproducibility, reliability, flexibility and reduce cost. The single crystal Silicon proof mass has minimal internal stress. AlGe bonding serves the dual function of 1) electrically connecting TSV in the cap wafer and the silicon electrodes/interconnects in the device wafer, and 2) hermetically sealing the MEMS cavity from external environment. The TSV and RDL allow great design flexibility and re-use for large automotive product families. We also introduced a quality methodology called Above-and-Beyond ($A$aB) in the development and product introduction, which enables UMEMS to be released in volume manufacturing with sub-lppm defectivity at early phase of production.