用于soc的系统级泄漏感知地板规划器

Aseem Gupta, N. Dutt, F. Kurdahi, K. Khouri, M. Abadir
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引用次数: 27

摘要

工艺缩放和更高的泄漏功率导致功率密度增加和模具温度升高。由于温度和泄漏功率的相互依赖性,我们观察到平面图对片上系统(SoC)中ip块的温度和泄漏都有影响。因此,在本文中,我们提出了一种新的系统级泄漏感知地板规划器(LEAF),它优化了温度感知泄漏功率的地板规划以及传统的面积和导线长度指标。我们的floorplanner采用SoC网表和功能模块的动态功率分布图来确定放置位置,同时优化与温度相关的泄漏功率、面积和导线长度。为了证明LEAF的有效性,我们在飞思卡尔半导体公司的10个工业SoC设计中实施了我们的方法,并评估了泄漏功率和面积之间的权衡。我们观察到,在没有泄漏和有泄漏意识的地板规划之间,泄漏功率相差高达190%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
LEAF: A System Level Leakage-Aware Floorplanner for SoCs
Process scaling and higher leakage power have resulted in increased power densities and elevated die temperatures. Due to the interdependence of temperature and leakage power, we observe that the floorplan has an impact on both the temperatures and the leakage of the IP-blocks in a system on chip (SoC). Hence, in this paper we propose a novel system level leakage aware floorplanner (LEAF) which optimizes floorplans for temperature-aware leakage power along with the traditional metrics of area and wire length. Our floorplanner takes a SoC netlist and the dynamic power profile of functional blocks to determine a placement while optimizing for temperature dependent leakage power, area, and wire length. To demonstrate the effectiveness of LEAF, we implemented our methodology on ten industrial SoC designs from Freescale Semiconductor Inc. and evaluated the trade-off between leakage power and area. We observed up to 190% difference in the leakage power between leakage-unaware and leakage aware floorplanning.
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