{"title":"具有源电流反馈和P-D控制器的大功率SiC-MOSFET模块有源栅极驱动器","authors":"Y. Noge, M. Shoyama, M. Deng","doi":"10.1109/ECCE-Asia49820.2021.9478986","DOIUrl":null,"url":null,"abstract":"This paper investigates an active gate driver for a large capacity multi-chip SiC-MOSFET power module. The active gate driver utilizes the reactive voltage of the source wire inductance as the negative feedback signal of the gate voltage. In addition, the feedback stabilization design is included in the circuit. The switching characteristics of the conventional resistive gate driver and the active gate driver are experimentally investigated by a double pulse test setup. The switching setup condition is 800 V / 300 A. This paper describes the construction of the active gate driver circuit and the experimental results. The over-shoot and ringing of the Vds and Is are reduced by using the active gate driver. In addition, the switching loss is simultaneously reduced.","PeriodicalId":145366,"journal":{"name":"2021 IEEE 12th Energy Conversion Congress & Exposition - Asia (ECCE-Asia)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Active Gate Driver for High Power SiC-MOSFET Module with Source Current Feedback and P-D controller\",\"authors\":\"Y. Noge, M. Shoyama, M. Deng\",\"doi\":\"10.1109/ECCE-Asia49820.2021.9478986\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper investigates an active gate driver for a large capacity multi-chip SiC-MOSFET power module. The active gate driver utilizes the reactive voltage of the source wire inductance as the negative feedback signal of the gate voltage. In addition, the feedback stabilization design is included in the circuit. The switching characteristics of the conventional resistive gate driver and the active gate driver are experimentally investigated by a double pulse test setup. The switching setup condition is 800 V / 300 A. This paper describes the construction of the active gate driver circuit and the experimental results. The over-shoot and ringing of the Vds and Is are reduced by using the active gate driver. In addition, the switching loss is simultaneously reduced.\",\"PeriodicalId\":145366,\"journal\":{\"name\":\"2021 IEEE 12th Energy Conversion Congress & Exposition - Asia (ECCE-Asia)\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-05-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE 12th Energy Conversion Congress & Exposition - Asia (ECCE-Asia)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECCE-Asia49820.2021.9478986\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 12th Energy Conversion Congress & Exposition - Asia (ECCE-Asia)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECCE-Asia49820.2021.9478986","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Active Gate Driver for High Power SiC-MOSFET Module with Source Current Feedback and P-D controller
This paper investigates an active gate driver for a large capacity multi-chip SiC-MOSFET power module. The active gate driver utilizes the reactive voltage of the source wire inductance as the negative feedback signal of the gate voltage. In addition, the feedback stabilization design is included in the circuit. The switching characteristics of the conventional resistive gate driver and the active gate driver are experimentally investigated by a double pulse test setup. The switching setup condition is 800 V / 300 A. This paper describes the construction of the active gate driver circuit and the experimental results. The over-shoot and ringing of the Vds and Is are reduced by using the active gate driver. In addition, the switching loss is simultaneously reduced.