二部图(k, 0, d)-可拓性的验证及其应用

Xuelian Wen
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引用次数: 0

摘要

图G中的缺陷d匹配是覆盖G中除d个顶点外的所有顶点的匹配,设G = (U, W)为U, W, |的二分图,其中W|≥|U|。设k, d为非负整数,使得k + d = |W|≥- |U|。如果从W中删除任意k个顶点,则G的剩余子图包含缺陷d匹配,则称G是(k, 0, d)可扩展的。(k, 0, d)可扩展二部图在鲁棒作业分配电路设计中的应用。本文研究了(k, 0, d)-可扩展二部图的性质和刻画。在此基础上,设计了一种确定二部图(k, 0, d)可扩展性的有效算法,并证明了该算法的时间复杂度大大优于基于该定义设计的算法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Verifying (k, 0, d)-extendability in bipartite graphs and its application
A defect d-matching in a graph G is a matching covering all but d vertices in G. Let G = (U, W) be a bipartite graph with bipartition U, W and |W|≥|U|. Let k, d be non-negative integers such that k + d = |W| ≥–|U|. If deleting any k vertices from W, the remaining subgraph of G contains a defect d-matching, then G is said to be (k, 0, d)-extendable. (k, 0, d)-extendable bipartite graphs find applications in designing the robust job assignment circuit. In this paper, we investigate the properties and characterizations of (k, 0, d)-extendable bipartite graphs. Basing on these results, an efficient algorithm to determine the (k, 0, d)-extendability of a bipartite graph is designed and we also prove that the time complexity of the algorithm is much better than that of the algorithm designed basing on the definition.
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