集成光伏组件可靠性性能表征新方法

William R. Bottenberg
{"title":"集成光伏组件可靠性性能表征新方法","authors":"William R. Bottenberg","doi":"10.1109/IRPS.2013.6532012","DOIUrl":null,"url":null,"abstract":"This paper describes the use of electroluminescence imaging (EL), infra-red imaging (IR), and module shading screen IV techniques to characterize individual cell performance in modules to aid in failure analysis (FA) during the reliability testing of new photovoltaic (PV) module designs. When integrated with detailed modeling into a uniform approach these methods yield a superior approach to understanding failure mechanisms that arise in modules during extended stress testing or analysis from field testing. These techniques are required to quickly assess and validate new materials and new constructions in module technology. Examples are taken from new module technologies such as monolithic module assembly (MMA) for back contact cell modules as well as the use of new materials such as electrically conductive adhesives (ECA) and new encapsulants.","PeriodicalId":138206,"journal":{"name":"2013 IEEE International Reliability Physics Symposium (IRPS)","volume":"87 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-04-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Integration of new methods for photovoltaic module reliability performance characterization\",\"authors\":\"William R. Bottenberg\",\"doi\":\"10.1109/IRPS.2013.6532012\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the use of electroluminescence imaging (EL), infra-red imaging (IR), and module shading screen IV techniques to characterize individual cell performance in modules to aid in failure analysis (FA) during the reliability testing of new photovoltaic (PV) module designs. When integrated with detailed modeling into a uniform approach these methods yield a superior approach to understanding failure mechanisms that arise in modules during extended stress testing or analysis from field testing. These techniques are required to quickly assess and validate new materials and new constructions in module technology. Examples are taken from new module technologies such as monolithic module assembly (MMA) for back contact cell modules as well as the use of new materials such as electrically conductive adhesives (ECA) and new encapsulants.\",\"PeriodicalId\":138206,\"journal\":{\"name\":\"2013 IEEE International Reliability Physics Symposium (IRPS)\",\"volume\":\"87 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-04-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE International Reliability Physics Symposium (IRPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRPS.2013.6532012\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE International Reliability Physics Symposium (IRPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.2013.6532012","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文描述了使用电致发光成像(EL),红外成像(IR)和模块遮光屏IV技术来表征模块中的单个电池性能,以帮助在新光伏(PV)模块设计可靠性测试期间进行故障分析(FA)。当与详细的建模集成到统一的方法中时,这些方法产生了一种更好的方法来理解在扩展压力测试或现场测试分析中出现的模块故障机制。这些技术需要快速评估和验证模块技术中的新材料和新结构。例子取自新的模块技术,如用于后接触电池模块的单片模块组装(MMA),以及导电粘合剂(ECA)和新型密封剂等新材料的使用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Integration of new methods for photovoltaic module reliability performance characterization
This paper describes the use of electroluminescence imaging (EL), infra-red imaging (IR), and module shading screen IV techniques to characterize individual cell performance in modules to aid in failure analysis (FA) during the reliability testing of new photovoltaic (PV) module designs. When integrated with detailed modeling into a uniform approach these methods yield a superior approach to understanding failure mechanisms that arise in modules during extended stress testing or analysis from field testing. These techniques are required to quickly assess and validate new materials and new constructions in module technology. Examples are taken from new module technologies such as monolithic module assembly (MMA) for back contact cell modules as well as the use of new materials such as electrically conductive adhesives (ECA) and new encapsulants.
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