{"title":"利用有理函数提取TDR/TDT测量中的s参数","authors":"S. Pannala, M. Swaminathan","doi":"10.1109/ARFTG.1999.327362","DOIUrl":null,"url":null,"abstract":"This paper discusses the extraction of broad band S-parameter response from transient reflection and transmission measurements. The method discussed uses the Generalized Pencil-of-Function method, recursive deconvolution and time referencing to develop models using rational functions. A low loss printed circuit board plane and a lossy thin film plane have been characterized using this method to extract the two-port S-parameters. These models are SPICE compatible and can be used to simulate the frequency or transient response. The results have been compared with network analyzer measurements to show the accuracy.","PeriodicalId":284470,"journal":{"name":"54th ARFTG Conference Digest","volume":"81 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Extraction of S-Parameters from TDR/TDT Measurements using Rational Functions\",\"authors\":\"S. Pannala, M. Swaminathan\",\"doi\":\"10.1109/ARFTG.1999.327362\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses the extraction of broad band S-parameter response from transient reflection and transmission measurements. The method discussed uses the Generalized Pencil-of-Function method, recursive deconvolution and time referencing to develop models using rational functions. A low loss printed circuit board plane and a lossy thin film plane have been characterized using this method to extract the two-port S-parameters. These models are SPICE compatible and can be used to simulate the frequency or transient response. The results have been compared with network analyzer measurements to show the accuracy.\",\"PeriodicalId\":284470,\"journal\":{\"name\":\"54th ARFTG Conference Digest\",\"volume\":\"81 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"54th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1999.327362\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"54th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1999.327362","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Extraction of S-Parameters from TDR/TDT Measurements using Rational Functions
This paper discusses the extraction of broad band S-parameter response from transient reflection and transmission measurements. The method discussed uses the Generalized Pencil-of-Function method, recursive deconvolution and time referencing to develop models using rational functions. A low loss printed circuit board plane and a lossy thin film plane have been characterized using this method to extract the two-port S-parameters. These models are SPICE compatible and can be used to simulate the frequency or transient response. The results have been compared with network analyzer measurements to show the accuracy.
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