{"title":"模拟电路的软故障测试与诊断","authors":"Peng Wang, Shiyuan Yang","doi":"10.1109/ISCAS.2005.1465055","DOIUrl":null,"url":null,"abstract":"A new SBT diagnosis approach for dealing with soft faults for analog circuits is presented in this paper. A serial of new fault models for analog components are provided and a numerical method which can be easily implemented replaces circuit analysis to obtain the fault models before test. Tolerance issues and multifault diagnosis are also discussed in this paper.","PeriodicalId":191200,"journal":{"name":"2005 IEEE International Symposium on Circuits and Systems","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Soft fault test and diagnosis for analog circuits\",\"authors\":\"Peng Wang, Shiyuan Yang\",\"doi\":\"10.1109/ISCAS.2005.1465055\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new SBT diagnosis approach for dealing with soft faults for analog circuits is presented in this paper. A serial of new fault models for analog components are provided and a numerical method which can be easily implemented replaces circuit analysis to obtain the fault models before test. Tolerance issues and multifault diagnosis are also discussed in this paper.\",\"PeriodicalId\":191200,\"journal\":{\"name\":\"2005 IEEE International Symposium on Circuits and Systems\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-05-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2005 IEEE International Symposium on Circuits and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISCAS.2005.1465055\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 IEEE International Symposium on Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISCAS.2005.1465055","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A new SBT diagnosis approach for dealing with soft faults for analog circuits is presented in this paper. A serial of new fault models for analog components are provided and a numerical method which can be easily implemented replaces circuit analysis to obtain the fault models before test. Tolerance issues and multifault diagnosis are also discussed in this paper.
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