互连电容提取模型

A. Husain
{"title":"互连电容提取模型","authors":"A. Husain","doi":"10.1109/ISQED.2001.915222","DOIUrl":null,"url":null,"abstract":"Commonly used numerical methods in capacitance extraction both for small and large circuit blocks are reviewed for a VLSI design. Boundary element based field solvers can effectively be used for small structures but can not be used for large structures because of large grid requirement. Field solvers based on random walk method are more appropriate for large structures but still they are quite slow in comparison to analytic capacitance models, which are generally applied for chip level extractions. Accounting for 3D fringing fields has become essential in analytic models for accurate extraction of current VLSI technologies.","PeriodicalId":110117,"journal":{"name":"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"28","resultStr":"{\"title\":\"Models for interconnect capacitance extraction\",\"authors\":\"A. Husain\",\"doi\":\"10.1109/ISQED.2001.915222\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Commonly used numerical methods in capacitance extraction both for small and large circuit blocks are reviewed for a VLSI design. Boundary element based field solvers can effectively be used for small structures but can not be used for large structures because of large grid requirement. Field solvers based on random walk method are more appropriate for large structures but still they are quite slow in comparison to analytic capacitance models, which are generally applied for chip level extractions. Accounting for 3D fringing fields has become essential in analytic models for accurate extraction of current VLSI technologies.\",\"PeriodicalId\":110117,\"journal\":{\"name\":\"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design\",\"volume\":\"37 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-03-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"28\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2001.915222\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2001.915222","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 28

摘要

对大型和小型电路块电容提取的常用数值方法进行了综述。基于边界元的场求解方法可以有效地求解小型结构,但由于对网格的要求较大,不能用于大型结构。基于随机漫步方法的现场求解器更适合于大型结构,但与通常用于芯片级提取的解析电容模型相比,其速度仍然很慢。为了准确地提取当前VLSI技术,在分析模型中考虑三维边缘场已成为必不可少的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Models for interconnect capacitance extraction
Commonly used numerical methods in capacitance extraction both for small and large circuit blocks are reviewed for a VLSI design. Boundary element based field solvers can effectively be used for small structures but can not be used for large structures because of large grid requirement. Field solvers based on random walk method are more appropriate for large structures but still they are quite slow in comparison to analytic capacitance models, which are generally applied for chip level extractions. Accounting for 3D fringing fields has become essential in analytic models for accurate extraction of current VLSI technologies.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信