S. Rosser, M. K. Kerr, C. S. Chang, J. Fang, Zhaoqing Chen, Yuzhe Chen
{"title":"多参考平面封装中同步开关噪声的测量与仿真","authors":"S. Rosser, M. K. Kerr, C. S. Chang, J. Fang, Zhaoqing Chen, Yuzhe Chen","doi":"10.1109/ECTC.1996.517456","DOIUrl":null,"url":null,"abstract":"A simplified laboratory experiment representing simultaneously switching circuits in a multi-reference plane package is described. Experimental data is compared to theoretical calculations and to simulated data from three modeling techniques of progressive complexity, including lumped element, hybrid lumped element/transmission line, and full wave solutions. The merits and limitations of each technique are presented.","PeriodicalId":143519,"journal":{"name":"1996 Proceedings 46th Electronic Components and Technology Conference","volume":"115 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":"{\"title\":\"Measurement and simulation of simultaneous switching noise in the multi-reference plane package\",\"authors\":\"S. Rosser, M. K. Kerr, C. S. Chang, J. Fang, Zhaoqing Chen, Yuzhe Chen\",\"doi\":\"10.1109/ECTC.1996.517456\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A simplified laboratory experiment representing simultaneously switching circuits in a multi-reference plane package is described. Experimental data is compared to theoretical calculations and to simulated data from three modeling techniques of progressive complexity, including lumped element, hybrid lumped element/transmission line, and full wave solutions. The merits and limitations of each technique are presented.\",\"PeriodicalId\":143519,\"journal\":{\"name\":\"1996 Proceedings 46th Electronic Components and Technology Conference\",\"volume\":\"115 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-05-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"13\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1996 Proceedings 46th Electronic Components and Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.1996.517456\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 Proceedings 46th Electronic Components and Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1996.517456","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Measurement and simulation of simultaneous switching noise in the multi-reference plane package
A simplified laboratory experiment representing simultaneously switching circuits in a multi-reference plane package is described. Experimental data is compared to theoretical calculations and to simulated data from three modeling techniques of progressive complexity, including lumped element, hybrid lumped element/transmission line, and full wave solutions. The merits and limitations of each technique are presented.