24gev质子辐照下4H-SiC辐射探测器性能的变化

V. Kažukauskas, R. Jasiulionis, V. Kalendra, J. Vaitkus
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引用次数: 0

摘要

研究了高能质子辐照对在4H-SiC上制成肖特基二极管的辐射探测器性能的影响。24gev质子的剂量范围从1013 cm-2到1016 cm-2。对辐照后产生的放射性核素和同位素的数量和活性进行了分析。7Be和22Na的活性与辐照剂量成正比,分别在1.3 ~ 890 Bq和1.9 ~ 950 Bq之间。采用电流-电压分析方法研究了接触特性。在较低的辐照剂量下,有效势垒高度从0.75 eV下降到< 0.7 eV。二极管的反向电流增加了一个数量级。在3 × 1015 cm-2以上的剂量下,观察到相反的变化。辐照量为1x1016个质子/cm-2时,势垒高度增加至~ 0.85 eV,反向电流下降达2个数量级。观测到的效应可以用高能粒子轰击造成的物质结构紊乱来解释。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Variation of the properties of 4H-SiC radiation detectors upon irradiation by 24 GeV protons
We had investigated effects of the high-energy proton irradiation on the properties of radiation detectors fabricated as Schottky diodes on 4H-SiC. The doses of 24 GeV protons ranged from 1013 cm-2 up to 1016 cm-2. Numbers and activities of radionuclides and isotopes produced after the irradiation were analysed. Activities of 7Be and 22Na were found to be proportional to the irradiation dose and ranged from 1.3 up to 890 Bq and from 1.9 up to 950 Bq, respectively. The contact properties were investigated by means of the current-voltage analysis. At lower irradiation doses a slight decrease of the effective potential barrier height from about 0.75 eV down to < 0.7 eV took place. The reverse current of the diodes grew by up to one order of magnitude. At the doses above 3x1015 cm-2 opposite changes were observed. Irradiation by up to 1x1016 protons/cm-2, resulted in the increase of the potential barrier height up to ~ 0.85 eV, followed by the drop of the reverse current by up to two orders of magnitude. The observed effects were explained by the appearance of the disordered material structure because of the high-energy particle bombardment.
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