{"title":"数字电路因地电位波动引起的故障机理。2","authors":"S. Nitta, K. Ebihara, A. Mutoh, H. Kakimoto","doi":"10.1109/ISEMC.1991.148264","DOIUrl":null,"url":null,"abstract":"For pt.I see ibid., vol.1, p.394 (1989). One of the causes of digital circuit malfunctions due to ground given potential fluctuation is clarified. Attention is given to the delay time occurring while ground potential fluctuation is propagating through the power supply line, its return line, signal line, and so on. It is experimentally and quantitatively clarified in the relationship among circuits malfunction, line length difference, ground potential level, and fluctuation frequency that the difference in each other's propagation is transformed to DC power supply fluctuation and signal-level fluctuation, and can be the cause of circuit malfunction.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"The malfunction mechanism of digital circuits due to ground potential fluctuations. II\",\"authors\":\"S. Nitta, K. Ebihara, A. Mutoh, H. Kakimoto\",\"doi\":\"10.1109/ISEMC.1991.148264\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"For pt.I see ibid., vol.1, p.394 (1989). One of the causes of digital circuit malfunctions due to ground given potential fluctuation is clarified. Attention is given to the delay time occurring while ground potential fluctuation is propagating through the power supply line, its return line, signal line, and so on. It is experimentally and quantitatively clarified in the relationship among circuits malfunction, line length difference, ground potential level, and fluctuation frequency that the difference in each other's propagation is transformed to DC power supply fluctuation and signal-level fluctuation, and can be the cause of circuit malfunction.<<ETX>>\",\"PeriodicalId\":243730,\"journal\":{\"name\":\"IEEE 1991 International Symposium on Electromagnetic Compatibility\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-08-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 1991 International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1991.148264\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 1991 International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1991.148264","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The malfunction mechanism of digital circuits due to ground potential fluctuations. II
For pt.I see ibid., vol.1, p.394 (1989). One of the causes of digital circuit malfunctions due to ground given potential fluctuation is clarified. Attention is given to the delay time occurring while ground potential fluctuation is propagating through the power supply line, its return line, signal line, and so on. It is experimentally and quantitatively clarified in the relationship among circuits malfunction, line length difference, ground potential level, and fluctuation frequency that the difference in each other's propagation is transformed to DC power supply fluctuation and signal-level fluctuation, and can be the cause of circuit malfunction.<>
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