A. Yokotani, T. Mukumoto, K. Kurosawa, T. Ninomiya, H. Sawada
{"title":"飞秒激光烧蚀薄硅衬底钻孔过程的时间分辨成像及其分析","authors":"A. Yokotani, T. Mukumoto, K. Kurosawa, T. Ninomiya, H. Sawada","doi":"10.1109/CLEOE.2005.1568444","DOIUrl":null,"url":null,"abstract":"In this paper, we have observed and analyzed the drilling process with femtosecond laser on the silicon surface in order to investigate a degree of thermal effect during the dicing process of the thin silicon substrate","PeriodicalId":354643,"journal":{"name":"CLEO/Europe. 2005 Conference on Lasers and Electro-Optics Europe, 2005.","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Time-resolving imaging and its analysis of drilling process of thin silicon substrates with femtosecond laser ablation\",\"authors\":\"A. Yokotani, T. Mukumoto, K. Kurosawa, T. Ninomiya, H. Sawada\",\"doi\":\"10.1109/CLEOE.2005.1568444\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we have observed and analyzed the drilling process with femtosecond laser on the silicon surface in order to investigate a degree of thermal effect during the dicing process of the thin silicon substrate\",\"PeriodicalId\":354643,\"journal\":{\"name\":\"CLEO/Europe. 2005 Conference on Lasers and Electro-Optics Europe, 2005.\",\"volume\":\"37 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-06-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"CLEO/Europe. 2005 Conference on Lasers and Electro-Optics Europe, 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CLEOE.2005.1568444\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"CLEO/Europe. 2005 Conference on Lasers and Electro-Optics Europe, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CLEOE.2005.1568444","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Time-resolving imaging and its analysis of drilling process of thin silicon substrates with femtosecond laser ablation
In this paper, we have observed and analyzed the drilling process with femtosecond laser on the silicon surface in order to investigate a degree of thermal effect during the dicing process of the thin silicon substrate