{"title":"用于应力分析的偏振敏感干涉仪","authors":"M. Sarkar, S. Sarkar, A. Basuray","doi":"10.1117/12.814545","DOIUrl":null,"url":null,"abstract":"In the present work a polarisation sensitive trangular path interferometer is developed to analyse the photoelastic stress pattern. To increase the sensitivity of the proposed interferometer a birefringent lens is used as a longitudinal interferometer to generate background fringes. The stress-induced birefringence of the sample will modify the fringe pattern, which gives a method for measurement of stress distribution of the sample. The method has all the advantages of a common path interferometer.","PeriodicalId":191475,"journal":{"name":"International Symposium on Laser Metrology","volume":"65 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A polarization sensitive interferometer for stress analysis\",\"authors\":\"M. Sarkar, S. Sarkar, A. Basuray\",\"doi\":\"10.1117/12.814545\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the present work a polarisation sensitive trangular path interferometer is developed to analyse the photoelastic stress pattern. To increase the sensitivity of the proposed interferometer a birefringent lens is used as a longitudinal interferometer to generate background fringes. The stress-induced birefringence of the sample will modify the fringe pattern, which gives a method for measurement of stress distribution of the sample. The method has all the advantages of a common path interferometer.\",\"PeriodicalId\":191475,\"journal\":{\"name\":\"International Symposium on Laser Metrology\",\"volume\":\"65 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-09-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Symposium on Laser Metrology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.814545\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Symposium on Laser Metrology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.814545","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A polarization sensitive interferometer for stress analysis
In the present work a polarisation sensitive trangular path interferometer is developed to analyse the photoelastic stress pattern. To increase the sensitivity of the proposed interferometer a birefringent lens is used as a longitudinal interferometer to generate background fringes. The stress-induced birefringence of the sample will modify the fringe pattern, which gives a method for measurement of stress distribution of the sample. The method has all the advantages of a common path interferometer.