用于应力分析的偏振敏感干涉仪

M. Sarkar, S. Sarkar, A. Basuray
{"title":"用于应力分析的偏振敏感干涉仪","authors":"M. Sarkar, S. Sarkar, A. Basuray","doi":"10.1117/12.814545","DOIUrl":null,"url":null,"abstract":"In the present work a polarisation sensitive trangular path interferometer is developed to analyse the photoelastic stress pattern. To increase the sensitivity of the proposed interferometer a birefringent lens is used as a longitudinal interferometer to generate background fringes. The stress-induced birefringence of the sample will modify the fringe pattern, which gives a method for measurement of stress distribution of the sample. The method has all the advantages of a common path interferometer.","PeriodicalId":191475,"journal":{"name":"International Symposium on Laser Metrology","volume":"65 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A polarization sensitive interferometer for stress analysis\",\"authors\":\"M. Sarkar, S. Sarkar, A. Basuray\",\"doi\":\"10.1117/12.814545\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the present work a polarisation sensitive trangular path interferometer is developed to analyse the photoelastic stress pattern. To increase the sensitivity of the proposed interferometer a birefringent lens is used as a longitudinal interferometer to generate background fringes. The stress-induced birefringence of the sample will modify the fringe pattern, which gives a method for measurement of stress distribution of the sample. The method has all the advantages of a common path interferometer.\",\"PeriodicalId\":191475,\"journal\":{\"name\":\"International Symposium on Laser Metrology\",\"volume\":\"65 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-09-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Symposium on Laser Metrology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.814545\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Symposium on Laser Metrology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.814545","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文研制了一种偏振敏感的三角路干涉仪来分析光弹性应力图。为了提高该干涉仪的灵敏度,采用双折射透镜作为纵向干涉仪来产生背景条纹。样品的应力诱导双折射会改变条纹图案,这为测量样品的应力分布提供了一种方法。该方法具有共程干涉仪的所有优点。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A polarization sensitive interferometer for stress analysis
In the present work a polarisation sensitive trangular path interferometer is developed to analyse the photoelastic stress pattern. To increase the sensitivity of the proposed interferometer a birefringent lens is used as a longitudinal interferometer to generate background fringes. The stress-induced birefringence of the sample will modify the fringe pattern, which gives a method for measurement of stress distribution of the sample. The method has all the advantages of a common path interferometer.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信