TOPNAV:通过工业过程工厂拓扑有效导航

Andreas Berlet, Julius Rückert, H. Koziolek, R. Drath, Mike Barth
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引用次数: 3

摘要

工艺工程师使用管道和仪表图(p&id)设计工业工艺装置。如今,根据历史信号趋势诊断植物干扰的数据分析师通常在纸上手动分析这些复杂的图表,这既耗时又容易出错。因此,在过去的15年里,研究人员提出了几种方法和工具,将这些图转换为可以由软件工具处理的机器可读模型。然而,这些工具缺乏复杂的查询接口和直观的可视化。我们提出了TOPNAV方法来导航植物拓扑模型和辅助数据分析。该方法支持系统地搜索拓扑模型中的元素和路径,并将结果提供给分析工具,以方便统计分析。在一项用户研究中,与手动P&ID分析相比,最多可减少90%的时间,同时显著减少错误。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
TOPNAV: Efficiently Navigating through Industrial Process Plant Topologies
Process engineers design industrial process plants using piping and instrumentation diagrams (P&IDs). Today, data analysts who diagnose plant disturbances based on historical signal trends usually analyze these complex diagrams manually on paper, which is time-consuming and error-prone. In the last 15 years, researchers have thus proposed several approaches and tools to turn these diagrams into machine-readable models that can be processed by software tools. Yet, these tools lack sophisticated query interfaces and intuitive visualizations. We propose the method TOPNAV to navigate plant topology models and aid data analytics. The method supports systematic searching for elements and paths in topology models and feeding the results into analytical tools to facilitate statistical analyses. In a user study, an up to 90% time reduction was observed compared to manual P&ID analysis, while reducing errors significantly.
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