{"title":"分布式线路的优化暂态仿真","authors":"D. Kuznetsov, J. Schutt-Ainé, R. Mittra","doi":"10.1109/MCMC.1995.512021","DOIUrl":null,"url":null,"abstract":"This paper summarizes the application of the optimal method to the simulation of uniform distributed lines. The method combines indirect numerical integration with the open-loop device model for distributed lines. The optimal method results in maximum efficiency, accuracy and practical applicability for the transient analysis of digital circuits. The optimal line model can be directly used in a circuit simulator, and lines can be characterized with frequency- or time-domain data samples. The efficiency of the optimal method makes possible an accurate simulation of real circuits, containing thousands of multiconductor nonuniform frequency-dependent lines and nonlinear active devices, with virtually no increase in the simulation time compared to that for the simple replacement of interconnects with lumped resistors.","PeriodicalId":223500,"journal":{"name":"Proceedings of 1995 IEEE Multi-Chip Module Conference (MCMC-95)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Optimal transient simulation of distributed lines\",\"authors\":\"D. Kuznetsov, J. Schutt-Ainé, R. Mittra\",\"doi\":\"10.1109/MCMC.1995.512021\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper summarizes the application of the optimal method to the simulation of uniform distributed lines. The method combines indirect numerical integration with the open-loop device model for distributed lines. The optimal method results in maximum efficiency, accuracy and practical applicability for the transient analysis of digital circuits. The optimal line model can be directly used in a circuit simulator, and lines can be characterized with frequency- or time-domain data samples. The efficiency of the optimal method makes possible an accurate simulation of real circuits, containing thousands of multiconductor nonuniform frequency-dependent lines and nonlinear active devices, with virtually no increase in the simulation time compared to that for the simple replacement of interconnects with lumped resistors.\",\"PeriodicalId\":223500,\"journal\":{\"name\":\"Proceedings of 1995 IEEE Multi-Chip Module Conference (MCMC-95)\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1995 IEEE Multi-Chip Module Conference (MCMC-95)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MCMC.1995.512021\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1995 IEEE Multi-Chip Module Conference (MCMC-95)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MCMC.1995.512021","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper summarizes the application of the optimal method to the simulation of uniform distributed lines. The method combines indirect numerical integration with the open-loop device model for distributed lines. The optimal method results in maximum efficiency, accuracy and practical applicability for the transient analysis of digital circuits. The optimal line model can be directly used in a circuit simulator, and lines can be characterized with frequency- or time-domain data samples. The efficiency of the optimal method makes possible an accurate simulation of real circuits, containing thousands of multiconductor nonuniform frequency-dependent lines and nonlinear active devices, with virtually no increase in the simulation time compared to that for the simple replacement of interconnects with lumped resistors.