{"title":"实时片上电源电压传感器及其在基于跟踪的定时误差定位中的应用","authors":"Miho Ueno, M. Hashimoto, T. Onoye","doi":"10.1109/IOLTS.2015.7229857","DOIUrl":null,"url":null,"abstract":"This paper presents an all-digital on-chip supply voltage sensor that captures one-shot voltage fluctuation every clock cycle. The proposed sensor was implemented on ASIC in 65nm process and FPGA. The obtained voltage resolution was 3.9mV and 29mV, respectively. This sensor is suitable for providing voltage information to trace-based error localization system. We experimentally show that the proposed sensor contributes to the facilitation of error localization.","PeriodicalId":413023,"journal":{"name":"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Real-time on-chip supply voltage sensor and its application to trace-based timing error localization\",\"authors\":\"Miho Ueno, M. Hashimoto, T. Onoye\",\"doi\":\"10.1109/IOLTS.2015.7229857\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an all-digital on-chip supply voltage sensor that captures one-shot voltage fluctuation every clock cycle. The proposed sensor was implemented on ASIC in 65nm process and FPGA. The obtained voltage resolution was 3.9mV and 29mV, respectively. This sensor is suitable for providing voltage information to trace-based error localization system. We experimentally show that the proposed sensor contributes to the facilitation of error localization.\",\"PeriodicalId\":413023,\"journal\":{\"name\":\"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-07-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IOLTS.2015.7229857\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2015.7229857","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Real-time on-chip supply voltage sensor and its application to trace-based timing error localization
This paper presents an all-digital on-chip supply voltage sensor that captures one-shot voltage fluctuation every clock cycle. The proposed sensor was implemented on ASIC in 65nm process and FPGA. The obtained voltage resolution was 3.9mV and 29mV, respectively. This sensor is suitable for providing voltage information to trace-based error localization system. We experimentally show that the proposed sensor contributes to the facilitation of error localization.