高速片上网络数据链路中时延变化的有效补偿

S. Höppner, D. Walter, H. Eisenreich, R. Schüffny
{"title":"高速片上网络数据链路中时延变化的有效补偿","authors":"S. Höppner, D. Walter, H. Eisenreich, R. Schüffny","doi":"10.1109/ISSOC.2010.5625534","DOIUrl":null,"url":null,"abstract":"This paper analyzes high-speed source-synchronous network-on-chip data links in terms of yield loss due to delay variations. We show that statistical process variations can significantly reduce yield at high data rates and high bus widths. An on-chip delay calibration architecture for individual calibration of rise and fall delay times is proposed and analyzed on system level using Monte Carlo simulations. A sizing strategy for compensation delay elements is derived for yield maximization with low effort in terms of chip area and energy consumption.","PeriodicalId":252669,"journal":{"name":"2010 International Symposium on System on Chip","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Efficient compensation of delay variations in high-speed network-on-chip data links\",\"authors\":\"S. Höppner, D. Walter, H. Eisenreich, R. Schüffny\",\"doi\":\"10.1109/ISSOC.2010.5625534\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper analyzes high-speed source-synchronous network-on-chip data links in terms of yield loss due to delay variations. We show that statistical process variations can significantly reduce yield at high data rates and high bus widths. An on-chip delay calibration architecture for individual calibration of rise and fall delay times is proposed and analyzed on system level using Monte Carlo simulations. A sizing strategy for compensation delay elements is derived for yield maximization with low effort in terms of chip area and energy consumption.\",\"PeriodicalId\":252669,\"journal\":{\"name\":\"2010 International Symposium on System on Chip\",\"volume\":\"47 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-11-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 International Symposium on System on Chip\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSOC.2010.5625534\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 International Symposium on System on Chip","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSOC.2010.5625534","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

本文分析了高速源同步片上网络数据链路由于时延变化而造成的成品率损失。我们表明,统计过程变化可以显著降低在高数据速率和高总线宽度下的良率。提出了一种片上延迟校准体系结构,用于单独校准上升和下降延迟时间,并利用蒙特卡罗仿真在系统级上进行了分析。提出了一种补偿延迟元件的尺寸调整策略,以实现在芯片面积和能耗方面的最大成品率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Efficient compensation of delay variations in high-speed network-on-chip data links
This paper analyzes high-speed source-synchronous network-on-chip data links in terms of yield loss due to delay variations. We show that statistical process variations can significantly reduce yield at high data rates and high bus widths. An on-chip delay calibration architecture for individual calibration of rise and fall delay times is proposed and analyzed on system level using Monte Carlo simulations. A sizing strategy for compensation delay elements is derived for yield maximization with low effort in terms of chip area and energy consumption.
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