Tao Wang, Varin Sriboonlue, Selman Ozbayat, Gerardo Romo. L, J. Shin, T. Michalka
{"title":"考虑接触电阻的SI/PI应用的精确插座建模和验证","authors":"Tao Wang, Varin Sriboonlue, Selman Ozbayat, Gerardo Romo. L, J. Shin, T. Michalka","doi":"10.1109/ISEMC.2019.8825282","DOIUrl":null,"url":null,"abstract":"In this paper, we propose an accurate socket modeling methodology for signal integrity and power integrity applications using a quasi-static EM solver. Contact resistance is considered since it is a non-negligible component in socket modeling. A Parallel Resonance Frequency (PRF) method is used to validate the EM model and verify the contact resistance. It is shown that a quasi-static solver can be used to extract S-parameter or RLGC parameters and construct an accurate equivalent model without port parasitic.","PeriodicalId":137753,"journal":{"name":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Accurate Socket Modeling And Validation For SI/PI Applications Considering Contact Resistance\",\"authors\":\"Tao Wang, Varin Sriboonlue, Selman Ozbayat, Gerardo Romo. L, J. Shin, T. Michalka\",\"doi\":\"10.1109/ISEMC.2019.8825282\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we propose an accurate socket modeling methodology for signal integrity and power integrity applications using a quasi-static EM solver. Contact resistance is considered since it is a non-negligible component in socket modeling. A Parallel Resonance Frequency (PRF) method is used to validate the EM model and verify the contact resistance. It is shown that a quasi-static solver can be used to extract S-parameter or RLGC parameters and construct an accurate equivalent model without port parasitic.\",\"PeriodicalId\":137753,\"journal\":{\"name\":\"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.2019.8825282\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2019.8825282","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Accurate Socket Modeling And Validation For SI/PI Applications Considering Contact Resistance
In this paper, we propose an accurate socket modeling methodology for signal integrity and power integrity applications using a quasi-static EM solver. Contact resistance is considered since it is a non-negligible component in socket modeling. A Parallel Resonance Frequency (PRF) method is used to validate the EM model and verify the contact resistance. It is shown that a quasi-static solver can be used to extract S-parameter or RLGC parameters and construct an accurate equivalent model without port parasitic.