{"title":"射频吸收器喇叭测试系统","authors":"L. Hemming, G. A. Sanchez","doi":"10.1109/ISEMC.1986.7568228","DOIUrl":null,"url":null,"abstract":"The RF Absorber Horn Test System The RF Absorber Horn Test System facilitates the measurement of high performance RF anechoic chamber absorbers over the 100 MHz to 18 GHz frequency range. Absorber reflectivity measurements as low as -50 dB are possible at normal incidence with practical sized samples. The test system consists of a square horn lined with high loss wedge absorber driven by a tapered horn section lined with flat high loss absorber. The ta pered section is fed by an electrically small source antenna and the square section houses a directional probe antenna which is moved longitudinally along the axis of the horn to detect the standing wave created by the electromagnetic wave reflecting from the test sam ple mounted in the end of the square horn and the uniform incident wave formed by the tapered horn at the source end. The measurement system and how it functions are detailed, and examples of measured and reduced data are given.","PeriodicalId":244612,"journal":{"name":"1986 IEEE International Symposium on Electromagnetic Compatibility","volume":"91 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1986-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"The RF Absorber Horn Test System\",\"authors\":\"L. Hemming, G. A. Sanchez\",\"doi\":\"10.1109/ISEMC.1986.7568228\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The RF Absorber Horn Test System The RF Absorber Horn Test System facilitates the measurement of high performance RF anechoic chamber absorbers over the 100 MHz to 18 GHz frequency range. Absorber reflectivity measurements as low as -50 dB are possible at normal incidence with practical sized samples. The test system consists of a square horn lined with high loss wedge absorber driven by a tapered horn section lined with flat high loss absorber. The ta pered section is fed by an electrically small source antenna and the square section houses a directional probe antenna which is moved longitudinally along the axis of the horn to detect the standing wave created by the electromagnetic wave reflecting from the test sam ple mounted in the end of the square horn and the uniform incident wave formed by the tapered horn at the source end. The measurement system and how it functions are detailed, and examples of measured and reduced data are given.\",\"PeriodicalId\":244612,\"journal\":{\"name\":\"1986 IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"91 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1986-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1986 IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1986.7568228\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1986 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1986.7568228","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The RF Absorber Horn Test System The RF Absorber Horn Test System facilitates the measurement of high performance RF anechoic chamber absorbers over the 100 MHz to 18 GHz frequency range. Absorber reflectivity measurements as low as -50 dB are possible at normal incidence with practical sized samples. The test system consists of a square horn lined with high loss wedge absorber driven by a tapered horn section lined with flat high loss absorber. The ta pered section is fed by an electrically small source antenna and the square section houses a directional probe antenna which is moved longitudinally along the axis of the horn to detect the standing wave created by the electromagnetic wave reflecting from the test sam ple mounted in the end of the square horn and the uniform incident wave formed by the tapered horn at the source end. The measurement system and how it functions are detailed, and examples of measured and reduced data are given.