用于低电压/功率应用的隧道场效应管的高性能设计:策略和解决方案

S. Chung
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引用次数: 0

摘要

本文将讨论用于低电压/低功率应用的隧道场效应管的设计策略和解决方案。已经证明了两种不同的方法。第一个设计是基于一个凸起的排水结构的设计,其结果是低Cgd,并减少源到漏的泄漏。第二种设计是基于对齐的概念之间的最大。电场和B2BT率来提高TFET的性能。在l -栅极结构晶体管中得到了验证。两种情况下都显示了离子电流的有效改善,较低的S.S.和良好的延迟性能。最后,将双向通栅极应用于互补的TFET SRAM,以改善WNM和RSNM,工作电压降至0.3V。这显示了所提出的TFET结构和方案在超低功耗应用中的巨大潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High performance design of tunneling FET for low voltage/power applications: Strategies and solutions
The strategy and solutions in the design of tunneling FET for low voltage/power applications will be addressed in this paper. Two different approaches have been demonstrated. The first design is based on the design of a raised-drain structure which results in a low Cgd, and the reduction of source-to-drain leakage. The second design is based on the concept of alignment between the max. electric field and B2BT rate to enhance the performance of TFET. It was demonstrated in an L-gate structure TFET. Both cases show an efficient improvement of the Ion current, lower S.S. and good delay performance. Finally, a bi-directional pass gate has been applied to complementary TFET SRAM to improve the WNM and RSNM, with operation voltage down to 0.3V. This shows great potential of the proposed TFET structure and schemes for ultra-low power applications.
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