霍尼韦尔辐射硬化32位处理器中央处理器，浮点处理器，和缓存存储器剂量率和单事件影响的测试结果

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference Pub Date : 1997-07-24 DOI:10.1109/REDW.1997.629808

G. Brown, L. Hoffmann, S.C. Leavy, J.A. Mogensen, J. Brichacek

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引用次数: 7

摘要

我们将介绍霍尼韦尔辐射硬化32位处理器中央处理器、浮点处理器和高速缓存存储器的单事件效应和剂量率测试结果。这三种芯片类型组成了32位抗辐射容错处理器的处理器核心。

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Honeywell radiation hardened 32-bit processor central processing unit, floating point processor, and cache memory dose rate and single event effects test results

We will present single event effects and dose rate test results for the Honeywell Radiation Hardened 32-Bit Processor Central Processing Unit, Floating Point Processor and Cache Memory. These three chip types comprise the processor core for a 32-bit radiation-hardened, fault-tolerant processor.

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来源期刊

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference

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