{"title":"基于IBIS的改进IO缓冲区行为建模方法的系统级验证","authors":"A. Varma, M. Steer, P. Franzon","doi":"10.1109/EPEP.2007.4387200","DOIUrl":null,"url":null,"abstract":"System level simulation and validation of a new macromodeling methodology based on IBIS (Input/Output Buffer Information Specification) models is presented. Enhancements of the black-box techniques discussed in [1] are discussed. The proposed macromodel is circuit based and can be customized by model makers or users. The new macromodel produces models that can be simulated accurately for Simultaneous Switching Noise (SSN). To demonstrate the solution, a CMOS voltage-mode driver circuit and a MICRON DDR2 driver are simulated using real life package models and compared with equivalent circuits created with IBIS models of the same drivers.","PeriodicalId":402571,"journal":{"name":"2007 IEEE Electrical Performance of Electronic Packaging","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"System level Validation of Improved IO Buffer Behavioral Modeling Methodology Based on IBIS\",\"authors\":\"A. Varma, M. Steer, P. Franzon\",\"doi\":\"10.1109/EPEP.2007.4387200\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"System level simulation and validation of a new macromodeling methodology based on IBIS (Input/Output Buffer Information Specification) models is presented. Enhancements of the black-box techniques discussed in [1] are discussed. The proposed macromodel is circuit based and can be customized by model makers or users. The new macromodel produces models that can be simulated accurately for Simultaneous Switching Noise (SSN). To demonstrate the solution, a CMOS voltage-mode driver circuit and a MICRON DDR2 driver are simulated using real life package models and compared with equivalent circuits created with IBIS models of the same drivers.\",\"PeriodicalId\":402571,\"journal\":{\"name\":\"2007 IEEE Electrical Performance of Electronic Packaging\",\"volume\":\"45 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-11-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE Electrical Performance of Electronic Packaging\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.2007.4387200\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Electrical Performance of Electronic Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2007.4387200","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
System level Validation of Improved IO Buffer Behavioral Modeling Methodology Based on IBIS
System level simulation and validation of a new macromodeling methodology based on IBIS (Input/Output Buffer Information Specification) models is presented. Enhancements of the black-box techniques discussed in [1] are discussed. The proposed macromodel is circuit based and can be customized by model makers or users. The new macromodel produces models that can be simulated accurately for Simultaneous Switching Noise (SSN). To demonstrate the solution, a CMOS voltage-mode driver circuit and a MICRON DDR2 driver are simulated using real life package models and compared with equivalent circuits created with IBIS models of the same drivers.