用于高频、高效率计算电源应用的增强型屏蔽栅沟槽mosfet

T. Sarkar, A. Challa, S. Sapp
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引用次数: 9

摘要

屏蔽栅沟槽-与传统栅沟槽器件相比,mosfet具有更优越的性能,因为它允许在漂移区域具有更高的掺杂密度,并通过在栅极和漏极之间放置中间电极为栅极提供“屏蔽效应”。然而,可以对屏蔽栅沟槽mosfet进行进一步的设计优化,以提高特别适合下一代高频计算电源应用的性能参数,本文已概述了这些参数。讨论了通道长度和阈值电压优化、衬底减薄和固有栅极电阻减小(通过布局增强)以及它们对器件占用空间减小的影响。此外,这些设计优化对高频开关变换器的功率损耗和效率的影响已经通过实验表征得到了证明。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Enhanced shielded-gate trench MOSFETs for high-frequency, high-efficiency computing power supply applications
Shielded-gate trench-MOSFETs yield superior performance compared to conventional gate trench devices by allowing higher doping density in the drift region and providing a `shielding effect' for the gate by placing an intermediate electrode between gate and drain. However, further design optimizations can be done for a shielded-gate trench-MOSFET to improve performance parameters particularly suited for next-generation high-frequency computing power supply applications and they have been outlined in this article. Channel length and threshold voltage optimization, substrate thinning and intrinsic gate resistance reduction (by layout enhancements) have been discussed along with their impact on device footprint reduction. Further, effects of these design optimizations on the power loss and efficiency of a high-frequency switching converter have been demonstrated through experimental characterizations.
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