GaN单晶的生长及同外延MOCVD层的性能

J. Baranowski, S. Porowski
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引用次数: 1

摘要

近年来,在N/sub / 2/压力高达20 kbar,温度接近1600/spl°C的液态镓溶液中生长出了高质量的GaN板。这些单晶已被用作MOCVD法生长GaN层的衬底。讨论了衬底端端Ga或N极性对同外延层质量的影响。介绍并讨论了同外延层的结构和光学性质。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Growth of GaN single crystals and properties of homoepitaxial MOCVD layers
Recently high quality GaN plates have been grown from the solution in liquid gallium at N/sub 2/ pressure up to 20 kbar and temperature close to 1600/spl deg/C. These single crystals have been used as substrates for homoepitaxial growth of GaN layer by MOCVD. The influence of the polarity of the Ga or N terminated surface of the substrate on the quality of the homoepitaxial layer is discussed. The structural and optical properties of homoepitaxial layers are presented and discussed.
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