栅极凹陷对AlGaN/GaN hemt线性特性的影响

A. Chini, D. Buttari, R. Coffie, L. Shen, T. Palacios, S. Heikman, A. Chakraborty, S. Keller, U. Mishra
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引用次数: 4

摘要

为了满足新一代通信系统的要求,基于gan的hemt是最有前途的器件。在这项工作中,具有平面(非嵌入式)和栅极嵌入式结构的器件已在同一晶圆上制造,并通过10 GHz的射频双音测量来表征。对于基于砷化镓的器件,通过栅极凹槽来增加器件的跨导被证明是非常有效的,从而导致大信号和小信号性能的整体改善,特别是它们的线性特性。进一步优化栅极凹槽可以在保持低失真水平的同时提高运行效率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effect of gate recessing on linearity characteristics of AlGaN/GaN HEMTs
GaN-based HEMTs are the most promising device in order to meet the requirements of new generation communication systems. In this work, devices with planar (unrecessed) and gate recessed structures have been fabricated on the same wafer, and characterized by means of RF two-tone measurements at 10 GHz. For GaAs-based devices, increasing device transconductance by means of gate recessing proved to be very effective, resulting in an overall improvement of both large and small signal performance, especially their linearity characteristics. Further optimization of gate recessing may result in higher efficiency operation while maintaining low distortion level.
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