InAs/Si异质结纳米线隧穿场效应晶体管几何结构及输运特性分析

Y. Miyoshi, M. Ogawa, S. Souma, Hajime Nakamura
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引用次数: 0

摘要

与传统的金属氧化物半导体场效应晶体管(mosfet)相比,带到带隧道场效应晶体管(BTBT)在降低泄漏电流和改善亚阈值特性方面是一种很有前途的策略。然而,btbt - fet的固有缺点是导通电流小。我们从数值上探讨了使用InAs/Si异质结纳米线(NW)解决btbt - fet固有困难的可能性,并发现与Si异质结纳米线相比,使用InAs/Si异质结纳米线在增加导通电流方面具有优势。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Analysis of geometrical structure and transport property in InAs/Si heterojunction nanowire tunneling field effect transistors
Band-to-band tunneling (BTBT) field-effect transistors (FETs) is one of the promisng strategies in reducing the leakage current and improving the subthreshold characteristics compared with the conventional metal-oxide-semiconductor field-effect transistors (MOSFETs). However, BTBT-FETs have an intrinsic drawback of small on-current. We explore numerically the possibility of using the InAs/Si heterojunction nanowire (NW) to resolve such intrinsic difficulty in BTBT-FETs, and found that the use of the InAs/Si heterojunction nanowire is advantageous in increasing the on-current compared with the Si homojunction nanowires.
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