H. Amrouch, J. Anders, S. Becker, M. Betka, G. Bleher, P. Domanski, N. Elhamawy, T. Ertl, A. Gatzastras, P. Genssler, S. Hasler, M. Heinrich, A. van Hoorn, H. Jafarzadeh, I. Kallfass, F. Klemme, S. Koch, R. Küsters, A. Lalama, Raphael Latty, Y. Liao, N. Lylina, Z. Haghi, D. Pflüger, I. Polian, J. Rivoir, M. Sauer, Denis Schwachhofer, S. Templin, C. Volmer, S. Wagner, D. Weiskopf, H. Wunderlich, B. Yang, M. Zimmermann
{"title":"智能测试和可靠性方法","authors":"H. Amrouch, J. Anders, S. Becker, M. Betka, G. Bleher, P. Domanski, N. Elhamawy, T. Ertl, A. Gatzastras, P. Genssler, S. Hasler, M. Heinrich, A. van Hoorn, H. Jafarzadeh, I. Kallfass, F. Klemme, S. Koch, R. Küsters, A. Lalama, Raphael Latty, Y. Liao, N. Lylina, Z. Haghi, D. Pflüger, I. Polian, J. Rivoir, M. Sauer, Denis Schwachhofer, S. Templin, C. Volmer, S. Wagner, D. Weiskopf, H. Wunderlich, B. Yang, M. Zimmermann","doi":"10.23919/DATE54114.2022.9774526","DOIUrl":null,"url":null,"abstract":"Test methods that can keep up with the ongoing increase in complexity of semiconductor products and their underlying technologies are an essential prerequisite for maintaining quality and safety of our daily lives and for continued success of our economies and societies. There is a huge potential how test methods can benefit from recent breakthroughs in domains such as artificial intelligence, data analytics, virtual/augmented reality, and security. The Graduate School on “Intelligent Methods for Semiconductor Test and Reliability” (GS-IMTR) at the University of Stuttgart is a large-scale, radically interdisciplinary effort to address the scientific-technological challenges in this domain. It is funded by Advantest, one of the world leaders in automatic test equipment. In this paper, we describe the overall philosophy of the Graduate School and the specific scientific questions targeted by its ten projects.","PeriodicalId":232583,"journal":{"name":"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"379 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Intelligent Methods for Test and Reliability\",\"authors\":\"H. Amrouch, J. Anders, S. Becker, M. Betka, G. Bleher, P. Domanski, N. Elhamawy, T. Ertl, A. Gatzastras, P. Genssler, S. Hasler, M. Heinrich, A. van Hoorn, H. Jafarzadeh, I. Kallfass, F. Klemme, S. Koch, R. Küsters, A. Lalama, Raphael Latty, Y. Liao, N. Lylina, Z. Haghi, D. Pflüger, I. Polian, J. Rivoir, M. Sauer, Denis Schwachhofer, S. Templin, C. Volmer, S. Wagner, D. Weiskopf, H. Wunderlich, B. Yang, M. Zimmermann\",\"doi\":\"10.23919/DATE54114.2022.9774526\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Test methods that can keep up with the ongoing increase in complexity of semiconductor products and their underlying technologies are an essential prerequisite for maintaining quality and safety of our daily lives and for continued success of our economies and societies. There is a huge potential how test methods can benefit from recent breakthroughs in domains such as artificial intelligence, data analytics, virtual/augmented reality, and security. The Graduate School on “Intelligent Methods for Semiconductor Test and Reliability” (GS-IMTR) at the University of Stuttgart is a large-scale, radically interdisciplinary effort to address the scientific-technological challenges in this domain. It is funded by Advantest, one of the world leaders in automatic test equipment. In this paper, we describe the overall philosophy of the Graduate School and the specific scientific questions targeted by its ten projects.\",\"PeriodicalId\":232583,\"journal\":{\"name\":\"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)\",\"volume\":\"379 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-03-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/DATE54114.2022.9774526\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/DATE54114.2022.9774526","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Test methods that can keep up with the ongoing increase in complexity of semiconductor products and their underlying technologies are an essential prerequisite for maintaining quality and safety of our daily lives and for continued success of our economies and societies. There is a huge potential how test methods can benefit from recent breakthroughs in domains such as artificial intelligence, data analytics, virtual/augmented reality, and security. The Graduate School on “Intelligent Methods for Semiconductor Test and Reliability” (GS-IMTR) at the University of Stuttgart is a large-scale, radically interdisciplinary effort to address the scientific-technological challenges in this domain. It is funded by Advantest, one of the world leaders in automatic test equipment. In this paper, we describe the overall philosophy of the Graduate School and the specific scientific questions targeted by its ten projects.
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