商用光相干DSP专用集成电路的单事件效应和总电离剂量评估

2017 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2017-07-01 DOI:10.1109/NSREC.2017.8115466

Raichelle J. Aniceto, Slaven Moro, R. Milanowski, C. Isabelle, N. Hall, B. Vermeire, K. Cahoy

{"title":"商用光相干DSP专用集成电路的单事件效应和总电离剂量评估","authors":"Raichelle J. Aniceto, Slaven Moro, R. Milanowski, C. Isabelle, N. Hall, B. Vermeire, K. Cahoy","doi":"10.1109/NSREC.2017.8115466","DOIUrl":null,"url":null,"abstract":"Experimental assessment of commercial 100/200 Gbps optical coherent DSP modem ASIC completed with 64 MeV and 480 MeV proton radiation test campaigns. Single event effect cross sections calculated and no performance degradation observed for proton fluence levels up to 1.27×1012 p/cm2 with equivalent total ionizing dose exposure to 170 krad(Si).","PeriodicalId":284506,"journal":{"name":"2017 IEEE Radiation Effects Data Workshop (REDW)","volume":"423 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Single event effect and total ionizing dose assessment of commercial optical coherent DSP ASIC\",\"authors\":\"Raichelle J. Aniceto, Slaven Moro, R. Milanowski, C. Isabelle, N. Hall, B. Vermeire, K. Cahoy\",\"doi\":\"10.1109/NSREC.2017.8115466\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Experimental assessment of commercial 100/200 Gbps optical coherent DSP modem ASIC completed with 64 MeV and 480 MeV proton radiation test campaigns. Single event effect cross sections calculated and no performance degradation observed for proton fluence levels up to 1.27×1012 p/cm2 with equivalent total ionizing dose exposure to 170 krad(Si).\",\"PeriodicalId\":284506,\"journal\":{\"name\":\"2017 IEEE Radiation Effects Data Workshop (REDW)\",\"volume\":\"423 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE Radiation Effects Data Workshop (REDW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSREC.2017.8115466\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC.2017.8115466","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 5

摘要

商用100/200 Gbps光相干DSP调制解调器ASIC的实验评估，完成64 MeV和480 MeV质子辐射测试活动。计算了单事件效应截面，在质子通量水平高达1.27×1012 p/cm2，总电离剂量暴露于170 krad(Si)时，未观察到性能下降。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Single event effect and total ionizing dose assessment of commercial optical coherent DSP ASIC

Experimental assessment of commercial 100/200 Gbps optical coherent DSP modem ASIC completed with 64 MeV and 480 MeV proton radiation test campaigns. Single event effect cross sections calculated and no performance degradation observed for proton fluence levels up to 1.27×1012 p/cm2 with equivalent total ionizing dose exposure to 170 krad(Si).

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2017 IEEE Radiation Effects Data Workshop (REDW)

自引率

0.00%

发文量