一种评价冗余分析算法的方法

Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing Pub Date : 2001-08-06 DOI:10.1109/MTDT.2001.945228

S. Shoukourian, V. Vardanian, Y. Zorian

{"title":"一种评价冗余分析算法的方法","authors":"S. Shoukourian, V. Vardanian, Y. Zorian","doi":"10.1109/MTDT.2001.945228","DOIUrl":null,"url":null,"abstract":"An approach for design and evaluation of redundancy analysis algorithms based on vectors of preferences is proposed for memory devices with spare elements. Experiments on the application of the new algorithms for self-test and repair (STAR) type SRAM memories have shown the efficiency of the proposed approach.","PeriodicalId":159230,"journal":{"name":"Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing","volume":"418 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-08-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"36","resultStr":"{\"title\":\"An approach for evaluation of redundancy analysis algorithms\",\"authors\":\"S. Shoukourian, V. Vardanian, Y. Zorian\",\"doi\":\"10.1109/MTDT.2001.945228\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An approach for design and evaluation of redundancy analysis algorithms based on vectors of preferences is proposed for memory devices with spare elements. Experiments on the application of the new algorithms for self-test and repair (STAR) type SRAM memories have shown the efficiency of the proposed approach.\",\"PeriodicalId\":159230,\"journal\":{\"name\":\"Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing\",\"volume\":\"418 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-08-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"36\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MTDT.2001.945228\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MTDT.2001.945228","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 36

摘要

提出了一种基于偏好向量的冗余分析算法设计与评价方法。将该算法应用于自检测和自修复(STAR)型SRAM存储器的实验表明了该方法的有效性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

An approach for evaluation of redundancy analysis algorithms

An approach for design and evaluation of redundancy analysis algorithms based on vectors of preferences is proposed for memory devices with spare elements. Experiments on the application of the new algorithms for self-test and repair (STAR) type SRAM memories have shown the efficiency of the proposed approach.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing

自引率

0.00%

发文量