超细间距球粘接技术的发展

K. Tatsumi, T. Uno, O. Kitamura, Y. Ohno, T. Katsumata, M. Furusawa
{"title":"超细间距球粘接技术的发展","authors":"K. Tatsumi, T. Uno, O. Kitamura, Y. Ohno, T. Katsumata, M. Furusawa","doi":"10.1109/IEMT.1995.526177","DOIUrl":null,"url":null,"abstract":"While the environment surrounding wire bonding, i.e., wire, lead frame, wire bonder, and capillary, is being developed more eagerly than ever, wire bonding technology which can better meet the more compact and higher density chips without modifying the existing assembly process is desired. This paper discusses reduction of the diameter of a ball to be formed at the tip of the wire, the required wire diameter reduction, capillary tip diameter reduction, and attainment of a higher Young's modulus for the wire which can suppress wire sweep in transfer molding, and indicates that wire bonding for a pitch of 70 /spl mu/m or less can be performed with no problem in reliability of the bonded zone.","PeriodicalId":123707,"journal":{"name":"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Development of ultra-fine pitch ball bonding technology\",\"authors\":\"K. Tatsumi, T. Uno, O. Kitamura, Y. Ohno, T. Katsumata, M. Furusawa\",\"doi\":\"10.1109/IEMT.1995.526177\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"While the environment surrounding wire bonding, i.e., wire, lead frame, wire bonder, and capillary, is being developed more eagerly than ever, wire bonding technology which can better meet the more compact and higher density chips without modifying the existing assembly process is desired. This paper discusses reduction of the diameter of a ball to be formed at the tip of the wire, the required wire diameter reduction, capillary tip diameter reduction, and attainment of a higher Young's modulus for the wire which can suppress wire sweep in transfer molding, and indicates that wire bonding for a pitch of 70 /spl mu/m or less can be performed with no problem in reliability of the bonded zone.\",\"PeriodicalId\":123707,\"journal\":{\"name\":\"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.1995.526177\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1995.526177","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

随着围绕线键合的环境,即导线、引线框架、线键合机和毛细管的发展比以往任何时候都更加迫切,人们需要在不改变现有组装工艺的情况下,更好地满足更紧凑、更高密度芯片的线键合技术。本文讨论了减小线材尖端成形球直径、减小线材直径、减小毛细线材尖端直径、提高线材杨氏模量以抑制传递成型中线材的扫线现象,指出在70 /spl mu/m或更小间距的线材粘接可以进行,且粘接区的可靠性没有问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Development of ultra-fine pitch ball bonding technology
While the environment surrounding wire bonding, i.e., wire, lead frame, wire bonder, and capillary, is being developed more eagerly than ever, wire bonding technology which can better meet the more compact and higher density chips without modifying the existing assembly process is desired. This paper discusses reduction of the diameter of a ball to be formed at the tip of the wire, the required wire diameter reduction, capillary tip diameter reduction, and attainment of a higher Young's modulus for the wire which can suppress wire sweep in transfer molding, and indicates that wire bonding for a pitch of 70 /spl mu/m or less can be performed with no problem in reliability of the bonded zone.
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