{"title":"组合电路的最小验证测试集","authors":"H. Michinishi, T. Yokohira, T. Okamoto","doi":"10.1109/ATS.1992.224428","DOIUrl":null,"url":null,"abstract":"A sufficient condition under which a minimum verification test set (MVTS) for a combinational circuit has 2/sup w/ elements is derived, where w is the maximum number of inputs on which any output depends, and an algorithm to find an NVTS with 2/sup w/ elements for any CUT with up to four outputs is described.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Minimum verification test set for combinational circuit\",\"authors\":\"H. Michinishi, T. Yokohira, T. Okamoto\",\"doi\":\"10.1109/ATS.1992.224428\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A sufficient condition under which a minimum verification test set (MVTS) for a combinational circuit has 2/sup w/ elements is derived, where w is the maximum number of inputs on which any output depends, and an algorithm to find an NVTS with 2/sup w/ elements for any CUT with up to four outputs is described.<<ETX>>\",\"PeriodicalId\":208029,\"journal\":{\"name\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"volume\":\"56 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-11-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1992.224428\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings First Asian Test Symposium (ATS `92)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1992.224428","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Minimum verification test set for combinational circuit
A sufficient condition under which a minimum verification test set (MVTS) for a combinational circuit has 2/sup w/ elements is derived, where w is the maximum number of inputs on which any output depends, and an algorithm to find an NVTS with 2/sup w/ elements for any CUT with up to four outputs is described.<>