Y. A. Tavares, Sewon Lee, Seunghyun Kim, Minjae Lee
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Calibration of M-Channel Time-Interleaved Analog-to-Digital Converters Based on Curve Fitting
This paper presents a foreground calibration for time-interleaved analog-to-digital converters (TI-ADCs) based on curve fitting for any TI-ADC interleaving order. It outperforms the cited methods by utilizing a hardware efficient digital correction scheme while obtaining an accurate estimation of the channels mismatches. A commercial 12-bit 3.6 GS/s TI-ADC is employed to validate the proposed calibration.