用瞬态光谱技术研究未掺杂半绝缘低碳砷化镓的深层受体态

F. Dubecký, J. Darmo, J. Betkó, G. Papaioannou, V. Ioannou, M. Baurngartner
{"title":"用瞬态光谱技术研究未掺杂半绝缘低碳砷化镓的深层受体态","authors":"F. Dubecký, J. Darmo, J. Betkó, G. Papaioannou, V. Ioannou, M. Baurngartner","doi":"10.1109/SIM.1992.752707","DOIUrl":null,"url":null,"abstract":"Deep states in undoped semi-insulating GaAs with low carbon content were investigated by PICTS and Photo-DLTS. Hall and Photo-Hall measurements proved that peaks observed in Photo-DLTS spectra are due to the electron emission from deep donor states. Other peaks obtained in PICTS spectra were attributed to the hole emission from acceptor states with the apparent energy levels E/sub pa/ /spl ap/ 0.18, 0.19, 0.21, 0.5 eV. A minimal value of their total concentration except of 0.5 eV level was estimated at about 1x10/sup 15/ cm/sup -3/. The peak of 0.5 eV level with dominant amplitude in detected spectra correlates with the hole emission from EL2/sup +/++/ double donor state. The 0.19 and 0.21 levels are most probably related to the double acceptor Ga/sub As/ antisite.defect.","PeriodicalId":368607,"journal":{"name":"Proceedings of the 7th Conference on Semi-insulating III-V Materials,","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-04-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Study of deep acceptor states in undoped Semi-insulating GaAs with low carbon content by transient spectroscopy techniques\",\"authors\":\"F. Dubecký, J. Darmo, J. Betkó, G. Papaioannou, V. Ioannou, M. Baurngartner\",\"doi\":\"10.1109/SIM.1992.752707\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Deep states in undoped semi-insulating GaAs with low carbon content were investigated by PICTS and Photo-DLTS. Hall and Photo-Hall measurements proved that peaks observed in Photo-DLTS spectra are due to the electron emission from deep donor states. Other peaks obtained in PICTS spectra were attributed to the hole emission from acceptor states with the apparent energy levels E/sub pa/ /spl ap/ 0.18, 0.19, 0.21, 0.5 eV. A minimal value of their total concentration except of 0.5 eV level was estimated at about 1x10/sup 15/ cm/sup -3/. The peak of 0.5 eV level with dominant amplitude in detected spectra correlates with the hole emission from EL2/sup +/++/ double donor state. The 0.19 and 0.21 levels are most probably related to the double acceptor Ga/sub As/ antisite.defect.\",\"PeriodicalId\":368607,\"journal\":{\"name\":\"Proceedings of the 7th Conference on Semi-insulating III-V Materials,\",\"volume\":\"62 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-04-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 7th Conference on Semi-insulating III-V Materials,\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SIM.1992.752707\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 7th Conference on Semi-insulating III-V Materials,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIM.1992.752707","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

利用PICTS和Photo-DLTS研究了低碳半绝缘未掺杂GaAs的深态。Hall和Photo-Hall测量证明了在Photo-DLTS光谱中观察到的峰是由于电子从深层供体态发射的。在PICTS光谱中获得的其他峰归因于表观能级为E/sub pa/ /spl ap/ 0.18、0.19、0.21和0.5 eV的受体态空穴发射。除0.5 eV水平外,其总浓度的最小值约为1 × 10/sup 15/ cm/sup -3/。探测光谱中占主导振幅的0.5 eV能级峰值与EL2/sup +/++/双给体态的空穴发射有关。0.19和0.21很可能与双受体Ga/sub / As/反位缺陷有关。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Study of deep acceptor states in undoped Semi-insulating GaAs with low carbon content by transient spectroscopy techniques
Deep states in undoped semi-insulating GaAs with low carbon content were investigated by PICTS and Photo-DLTS. Hall and Photo-Hall measurements proved that peaks observed in Photo-DLTS spectra are due to the electron emission from deep donor states. Other peaks obtained in PICTS spectra were attributed to the hole emission from acceptor states with the apparent energy levels E/sub pa/ /spl ap/ 0.18, 0.19, 0.21, 0.5 eV. A minimal value of their total concentration except of 0.5 eV level was estimated at about 1x10/sup 15/ cm/sup -3/. The peak of 0.5 eV level with dominant amplitude in detected spectra correlates with the hole emission from EL2/sup +/++/ double donor state. The 0.19 and 0.21 levels are most probably related to the double acceptor Ga/sub As/ antisite.defect.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信