SPENVIS在NEqO环境中的辐射特性和SEU率

Souaad, Manzar, R. A. Rahim, S. F. Sabri, N. Hasbullah
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引用次数: 1

摘要

RazakSat1是在近赤道轨道(NEqO)发射的,其中捕获的质子/电子(TP/TE)和银河宇宙射线(GCR)对卫星的存储器有强烈的影响,如基于FPGA的SRAM。由于这种破坏性影响,研究轨道辐射环境对于预测基于SRAM的FPGA的6T SRAM的SEU率具有重要意义。本研究专门针对RazakSat卫星轨道对NEqO的辐射环境进行了研究。太阳事件粒子(sep)、俘获质子/电子(TP/TE)和银河宇宙射线(GCR)是本研究考虑的三个主要辐射源。模拟了这三种类型的通量谱,并利用NEqO轨道的SPENVIS模型预测了180nm 6T SRAM的SEU率。结果表明,GCR通量在NEqO处占主导地位,达到105 MeV, TE为4MeV, TP为400 MeV。然而,如果磁屏蔽大气是打开的,就没有太阳粒子通量,几乎没有探测到单原子中微子。结果还表明,当设备没有屏蔽(6T SRAM)时,NEqO的SEU速率为0.5次/比特天,但当设备被0.5 g/cm2的铝屏蔽时,该速率降低了1.6 x 106倍。本文还比较了NEqO与极轨道在屏蔽效应和单粒子流率方面的差异。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Radiation Characteristics and SEU Rates in NEqO Environment Using SPENVIS
RazakSat1 was launched at Near Equatorial Orbit (NEqO) where Trapped Protons / Electrons (TP/TE) and Galactic Cosmic Rays (GCR) has intensive effect on satellite's memory like SRAM based FPGA. Due to this devastating effect, it is important to investigate the radiation environment of the orbit to predict the SEU rate for 6T SRAM, which is the building block of SRAM based FPGA. This study investigates the radiation environment in NEqO specifically for the orbit of RazakSat satellite. Solar Event Particles (SEPs), Trapped Protons / Electrons (TP/TE) and Galactic Cosmic Rays (GCR) are the three main sources of radiation which are taken to consideration in this study. The fluxes spectra of these three types are simulated and SEU rates for 180nm 6T SRAM are predicted using SPENVIS models for NEqO orbit. The results show that GCR fluxes are the most dominant at NEqO which reached to 105 MeV whereas TE has 4MeV and TP has the second dominant fluxes with 400 MeV. However, if the magnetic shielding atmosphere is on, there are no solar particles fluxes and almost no SEU was detected. Results also illustrate that SEU rates at NEqO is 0.5 upset / bit day when there is no shielding to the device (6T SRAM) but this rates reduced by 1.6 x 106 times when the device shielded by 0.5 g/cm2 of Aluminium. Comparisons of NEqO with polar orbit in terms of shielding effect and SEU rates are also presented in this study.
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