{"title":"冷凝热成像——一种定位半导体芯片短路和测定表面温度的新方法","authors":"A. Dermarderosian, V. Gionet, V. Caccamesi","doi":"10.1109/IRPS.1981.363009","DOIUrl":null,"url":null,"abstract":"A simple and inexpensive technique for locating shorts/hot spots and measuring surface temperatures of semiconductor die is described and detailed with some examples. The technique involves the visual observation of the point at which liquid evaporation (shorts/hot spots) or gaseous condensation (surface temperature) occurs on the surface of the semiconductor die. A 16 mm motion picture film has been made which vividly demonstrates these effects.","PeriodicalId":376954,"journal":{"name":"19th International Reliability Physics Symposium","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1981-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Condensation Thermography - A Novel Approach for Locating Short Circuits and Determing Surface Temperatures in Semiconductor Die\",\"authors\":\"A. Dermarderosian, V. Gionet, V. Caccamesi\",\"doi\":\"10.1109/IRPS.1981.363009\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A simple and inexpensive technique for locating shorts/hot spots and measuring surface temperatures of semiconductor die is described and detailed with some examples. The technique involves the visual observation of the point at which liquid evaporation (shorts/hot spots) or gaseous condensation (surface temperature) occurs on the surface of the semiconductor die. A 16 mm motion picture film has been made which vividly demonstrates these effects.\",\"PeriodicalId\":376954,\"journal\":{\"name\":\"19th International Reliability Physics Symposium\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1981-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"19th International Reliability Physics Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRPS.1981.363009\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"19th International Reliability Physics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.1981.363009","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Condensation Thermography - A Novel Approach for Locating Short Circuits and Determing Surface Temperatures in Semiconductor Die
A simple and inexpensive technique for locating shorts/hot spots and measuring surface temperatures of semiconductor die is described and detailed with some examples. The technique involves the visual observation of the point at which liquid evaporation (shorts/hot spots) or gaseous condensation (surface temperature) occurs on the surface of the semiconductor die. A 16 mm motion picture film has been made which vividly demonstrates these effects.
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