Wei Jiang, Yongda Hu, S. Bao, Song Lijie, Zheng Yuwei, Yongqiang Cui, Li Qiang
{"title":"MLCC绝缘电阻下降原因分析","authors":"Wei Jiang, Yongda Hu, S. Bao, Song Lijie, Zheng Yuwei, Yongqiang Cui, Li Qiang","doi":"10.1109/ICEPT.2015.7236807","DOIUrl":null,"url":null,"abstract":"In this paper, based on the results of SEM and EDS analysis, I would like to share the discovery of MLCC failure due to insulation resistance. For external factors, The defects which caused by mechanical stress can lead to lack of insulation resistance. For the intrinsic factors, MLCC insulation resistance failure is due to the presence of defects, and the main defects include void in ceramic dielectric and delamination of porcelain body and inner electrode. These defects are difficult to analyze. With the help of SEM electron microscope detection, these defets can be see. The reason is the poor control of sintering process.In the test,these defects will cause the capacitor quickly form a conductive channel, finally lead to insulation resistance failure.","PeriodicalId":415934,"journal":{"name":"2015 16th International Conference on Electronic Packaging Technology (ICEPT)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Analysis on the causes of decline of MLCC insulation resistance\",\"authors\":\"Wei Jiang, Yongda Hu, S. Bao, Song Lijie, Zheng Yuwei, Yongqiang Cui, Li Qiang\",\"doi\":\"10.1109/ICEPT.2015.7236807\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, based on the results of SEM and EDS analysis, I would like to share the discovery of MLCC failure due to insulation resistance. For external factors, The defects which caused by mechanical stress can lead to lack of insulation resistance. For the intrinsic factors, MLCC insulation resistance failure is due to the presence of defects, and the main defects include void in ceramic dielectric and delamination of porcelain body and inner electrode. These defects are difficult to analyze. With the help of SEM electron microscope detection, these defets can be see. The reason is the poor control of sintering process.In the test,these defects will cause the capacitor quickly form a conductive channel, finally lead to insulation resistance failure.\",\"PeriodicalId\":415934,\"journal\":{\"name\":\"2015 16th International Conference on Electronic Packaging Technology (ICEPT)\",\"volume\":\"53 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-09-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 16th International Conference on Electronic Packaging Technology (ICEPT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICEPT.2015.7236807\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 16th International Conference on Electronic Packaging Technology (ICEPT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT.2015.7236807","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analysis on the causes of decline of MLCC insulation resistance
In this paper, based on the results of SEM and EDS analysis, I would like to share the discovery of MLCC failure due to insulation resistance. For external factors, The defects which caused by mechanical stress can lead to lack of insulation resistance. For the intrinsic factors, MLCC insulation resistance failure is due to the presence of defects, and the main defects include void in ceramic dielectric and delamination of porcelain body and inner electrode. These defects are difficult to analyze. With the help of SEM electron microscope detection, these defets can be see. The reason is the poor control of sintering process.In the test,these defects will cause the capacitor quickly form a conductive channel, finally lead to insulation resistance failure.