基于累加器的低成本测试模式生成体系结构

2008 14th IEEE International On-Line Testing Symposium Pub Date : 2008-07-07 DOI:10.1109/IOLTS.2008.54

D. Magos, I. Voyiatzis, S. Tarnick

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引用次数: 2

摘要

提出了一种在基于累加器的测试模式生成中减少测试应用时间的新方案。该方案对硬件的要求极低。它基于一个解码器，其输入由一个非常慢的外部测试器驱动。在ISCAS基准测试上的实验结果证实，与之前发表的基于累加器的测试集嵌入方法相比，测试时间减少了75%-95%。

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A Low-Cost Accumulator-Based Test Pattern Generation Architecture

A novel scheme for reducing the test application time in accumulator-based test-pattern generation is presented. The proposed scheme exhibits extremely low demand for hardware. It is based on a decoder whose inputs are driven by a very slow external tester. Experimental results on ISCAS benchmarks substantiate a test-time reduction of 75%-95% when compared to previously published test-set embedding approaches for accumulator-based test generation.

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2008 14th IEEE International On-Line Testing Symposium

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