Automated analysis of propagation induced pulse broadening of single event transients

The propagation of single event transients (SET) is modeled and simulated, considering the significant modifications of the transient pulse width observed in the literature. We show how to evaluate the impact of Bias Temperature Instability (BTI) on the propagation of SETs in logic circuits with an accurate SPICE simulator developed at our lab, and compare the simulation results to relevant experimental data from the literature. There has been a growing interest in applying automated techniques to analyze the propagation induced pulse broadening (PIPB) effects in modern digital circuits. Simulators available to the circuit designer do not predict the possibility that a SET pulse may suffer PIPB. We present an electrical simulator capable of analyzing the PIPB effect.