T. Kawahara, T. Sakata, K. Itoh, Y. Kawajiri, T. Akiba, G. Kitsukawa, M. Aoki
{"title":"用于gb级DRAM阵列的高速阈值电压失配补偿感测放大器","authors":"T. Kawahara, T. Sakata, K. Itoh, Y. Kawajiri, T. Akiba, G. Kitsukawa, M. Aoki","doi":"10.1109/ESSCIRC.1992.5468393","DOIUrl":null,"url":null,"abstract":"A high-speed, small-area DRAM sense amplifier with a threshold-voltage (VT) mismatch compensation function is proposed. This sense amplifier features a unique hierarchy data-line architecture with a direct sensing scheme which uses only nMOS transistors in the array, and a simple VT mismatch compensation circuitry which uses a pair of nMOS switching transistors. The layout area of the sense amplifier is reduced to 70% of that of conventional common I/O CMOS sense amplifiers due to removing pMOS transistors from the array. The read-out time is improved to 35% that of conventional CMOS sense amplifiers, because of direct sensing and there is a 90% reduction in VT mismatch. This sense amplifier eliminates the sensitivity degradation and the area overhead increase that are expected in future Gb-scale DRAM arrays.","PeriodicalId":242379,"journal":{"name":"ESSCIRC '92: Eighteenth European Solid-State Circuits conference","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"A High-Speed, Threshold-Voltage-Mismatch Compensation Sense Amplifier for Gb-scale DRAM Arrays\",\"authors\":\"T. Kawahara, T. Sakata, K. Itoh, Y. Kawajiri, T. Akiba, G. Kitsukawa, M. Aoki\",\"doi\":\"10.1109/ESSCIRC.1992.5468393\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A high-speed, small-area DRAM sense amplifier with a threshold-voltage (VT) mismatch compensation function is proposed. This sense amplifier features a unique hierarchy data-line architecture with a direct sensing scheme which uses only nMOS transistors in the array, and a simple VT mismatch compensation circuitry which uses a pair of nMOS switching transistors. The layout area of the sense amplifier is reduced to 70% of that of conventional common I/O CMOS sense amplifiers due to removing pMOS transistors from the array. The read-out time is improved to 35% that of conventional CMOS sense amplifiers, because of direct sensing and there is a 90% reduction in VT mismatch. This sense amplifier eliminates the sensitivity degradation and the area overhead increase that are expected in future Gb-scale DRAM arrays.\",\"PeriodicalId\":242379,\"journal\":{\"name\":\"ESSCIRC '92: Eighteenth European Solid-State Circuits conference\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ESSCIRC '92: Eighteenth European Solid-State Circuits conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSCIRC.1992.5468393\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSCIRC '92: Eighteenth European Solid-State Circuits conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIRC.1992.5468393","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A High-Speed, Threshold-Voltage-Mismatch Compensation Sense Amplifier for Gb-scale DRAM Arrays
A high-speed, small-area DRAM sense amplifier with a threshold-voltage (VT) mismatch compensation function is proposed. This sense amplifier features a unique hierarchy data-line architecture with a direct sensing scheme which uses only nMOS transistors in the array, and a simple VT mismatch compensation circuitry which uses a pair of nMOS switching transistors. The layout area of the sense amplifier is reduced to 70% of that of conventional common I/O CMOS sense amplifiers due to removing pMOS transistors from the array. The read-out time is improved to 35% that of conventional CMOS sense amplifiers, because of direct sensing and there is a 90% reduction in VT mismatch. This sense amplifier eliminates the sensitivity degradation and the area overhead increase that are expected in future Gb-scale DRAM arrays.