用于gb级DRAM阵列的高速阈值电压失配补偿感测放大器

T. Kawahara, T. Sakata, K. Itoh, Y. Kawajiri, T. Akiba, G. Kitsukawa, M. Aoki
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引用次数: 4

摘要

提出了一种具有阈值电压失配补偿功能的高速小面积DRAM感测放大器。该传感放大器具有独特的分层数据线结构,采用阵列中仅使用nMOS晶体管的直接传感方案,以及使用一对nMOS开关晶体管的简单VT失配补偿电路。由于从阵列中去除pMOS晶体管,该感测放大器的布局面积减少到传统普通I/O CMOS感测放大器的70%。由于直接感测,读出时间提高到传统CMOS感测放大器的35%,并且VT失配减少了90%。这种感测放大器消除了未来gb级DRAM阵列中预期的灵敏度下降和面积开销增加。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A High-Speed, Threshold-Voltage-Mismatch Compensation Sense Amplifier for Gb-scale DRAM Arrays
A high-speed, small-area DRAM sense amplifier with a threshold-voltage (VT) mismatch compensation function is proposed. This sense amplifier features a unique hierarchy data-line architecture with a direct sensing scheme which uses only nMOS transistors in the array, and a simple VT mismatch compensation circuitry which uses a pair of nMOS switching transistors. The layout area of the sense amplifier is reduced to 70% of that of conventional common I/O CMOS sense amplifiers due to removing pMOS transistors from the array. The read-out time is improved to 35% that of conventional CMOS sense amplifiers, because of direct sensing and there is a 90% reduction in VT mismatch. This sense amplifier eliminates the sensitivity degradation and the area overhead increase that are expected in future Gb-scale DRAM arrays.
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