罗西隔离SOI MOSFET的窄宽度效应

S. Fung, M. Chan, S.T.H. Chan, P. Ko
{"title":"罗西隔离SOI MOSFET的窄宽度效应","authors":"S. Fung, M. Chan, S.T.H. Chan, P. Ko","doi":"10.1109/SOI.1995.526474","DOIUrl":null,"url":null,"abstract":"The recent demand for low-power electronics has driven narrow-width MOSFETs into applications. Meanwhile, SOI devices offer significant power reduction as compared with bulk devices due to the reduced parasitic capacitances. Therefore, it is very attractive to apply narrow-width MOSFETs fabricated on SOI substrate in low-power digital and analog design. However, the behavior of narrow-width SOI MOSFETs has never been reported. In this paper, the threshold voltage behavior of narrow-width FD/NFD SOI MOSFETs with ROSIE (Re-Oxidized Silicon Island Edges) isolation is reported for the first time.","PeriodicalId":149490,"journal":{"name":"1995 IEEE International SOI Conference Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1995-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Narrow width effect of ROSIE isolated SOI MOSFET\",\"authors\":\"S. Fung, M. Chan, S.T.H. Chan, P. Ko\",\"doi\":\"10.1109/SOI.1995.526474\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The recent demand for low-power electronics has driven narrow-width MOSFETs into applications. Meanwhile, SOI devices offer significant power reduction as compared with bulk devices due to the reduced parasitic capacitances. Therefore, it is very attractive to apply narrow-width MOSFETs fabricated on SOI substrate in low-power digital and analog design. However, the behavior of narrow-width SOI MOSFETs has never been reported. In this paper, the threshold voltage behavior of narrow-width FD/NFD SOI MOSFETs with ROSIE (Re-Oxidized Silicon Island Edges) isolation is reported for the first time.\",\"PeriodicalId\":149490,\"journal\":{\"name\":\"1995 IEEE International SOI Conference Proceedings\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-10-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1995 IEEE International SOI Conference Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SOI.1995.526474\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1995 IEEE International SOI Conference Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SOI.1995.526474","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

最近对低功耗电子器件的需求推动了窄宽度mosfet的应用。同时,由于寄生电容的减小,SOI器件与本体器件相比具有显著的功耗降低。因此,在SOI衬底上制作窄宽mosfet在低功耗数字和模拟设计中具有很大的吸引力。然而,窄宽度SOI mosfet的行为从未被报道过。本文首次报道了具有ROSIE(再氧化硅岛边缘)隔离的窄宽度FD/NFD SOI mosfet的阈值电压行为。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Narrow width effect of ROSIE isolated SOI MOSFET
The recent demand for low-power electronics has driven narrow-width MOSFETs into applications. Meanwhile, SOI devices offer significant power reduction as compared with bulk devices due to the reduced parasitic capacitances. Therefore, it is very attractive to apply narrow-width MOSFETs fabricated on SOI substrate in low-power digital and analog design. However, the behavior of narrow-width SOI MOSFETs has never been reported. In this paper, the threshold voltage behavior of narrow-width FD/NFD SOI MOSFETs with ROSIE (Re-Oxidized Silicon Island Edges) isolation is reported for the first time.
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