{"title":"加强覆盖过程的控制和效率[逻辑验证]","authors":"S. Fine, A. Ziv","doi":"10.1109/HLDVT.2003.1252481","DOIUrl":null,"url":null,"abstract":"Coverage directed test generation (CDG) is a technique for providing feedback from the coverage domain back to a generator that produces new stimuli to the tested design. In this paper, we describe two algorithms that act in a CDG framework. The first algorithm controls the coverage events distribution using a \"water-filling\" approach. The second algorithm improves the efficiency of the covering process using clustering techniques.","PeriodicalId":344813,"journal":{"name":"Eighth IEEE International High-Level Design Validation and Test Workshop","volume":"157 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Enhancing the control and efficiency of the covering process [logic verification]\",\"authors\":\"S. Fine, A. Ziv\",\"doi\":\"10.1109/HLDVT.2003.1252481\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Coverage directed test generation (CDG) is a technique for providing feedback from the coverage domain back to a generator that produces new stimuli to the tested design. In this paper, we describe two algorithms that act in a CDG framework. The first algorithm controls the coverage events distribution using a \\\"water-filling\\\" approach. The second algorithm improves the efficiency of the covering process using clustering techniques.\",\"PeriodicalId\":344813,\"journal\":{\"name\":\"Eighth IEEE International High-Level Design Validation and Test Workshop\",\"volume\":\"157 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-11-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Eighth IEEE International High-Level Design Validation and Test Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HLDVT.2003.1252481\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Eighth IEEE International High-Level Design Validation and Test Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HLDVT.2003.1252481","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Enhancing the control and efficiency of the covering process [logic verification]
Coverage directed test generation (CDG) is a technique for providing feedback from the coverage domain back to a generator that produces new stimuli to the tested design. In this paper, we describe two algorithms that act in a CDG framework. The first algorithm controls the coverage events distribution using a "water-filling" approach. The second algorithm improves the efficiency of the covering process using clustering techniques.