{"title":"基于物理的非准静态MOSFET模型,用于直流、交流和瞬态电路分析","authors":"T. Pesic, N. Jankovic","doi":"10.1109/ICMEL.2004.1314611","DOIUrl":null,"url":null,"abstract":"In this paper, we describe a compact physical-based non-quasi static (NQS) MOST model for SPICE. Based on the comparison with results of 2-D device simulations, it is shown that new NQS model can accurately predict NMOST behavior during DC, AC and transient operation.","PeriodicalId":202761,"journal":{"name":"2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Physical-based non-quasi static MOSFET model for DC, AC and transient circuit analysis\",\"authors\":\"T. Pesic, N. Jankovic\",\"doi\":\"10.1109/ICMEL.2004.1314611\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we describe a compact physical-based non-quasi static (NQS) MOST model for SPICE. Based on the comparison with results of 2-D device simulations, it is shown that new NQS model can accurately predict NMOST behavior during DC, AC and transient operation.\",\"PeriodicalId\":202761,\"journal\":{\"name\":\"2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716)\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-05-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMEL.2004.1314611\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMEL.2004.1314611","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Physical-based non-quasi static MOSFET model for DC, AC and transient circuit analysis
In this paper, we describe a compact physical-based non-quasi static (NQS) MOST model for SPICE. Based on the comparison with results of 2-D device simulations, it is shown that new NQS model can accurately predict NMOST behavior during DC, AC and transient operation.