G. White, E. Perfecto, T. Demercurio, D. Mcherron, T. Redmond, M. Norcott
{"title":"大幅面制造:低成本MCM-D的实用方法","authors":"G. White, E. Perfecto, T. Demercurio, D. Mcherron, T. Redmond, M. Norcott","doi":"10.1109/ICMCM.1994.753534","DOIUrl":null,"url":null,"abstract":"The IBM Microelectronics Division at East Fishkill has recently demonstrated the fabrication of thin films for MCM-D on large area panels, 300 mm x 300 mm in size. Fabrication of the thin films was accomplished on IBM's 300 mm development Line using immersion development of photosensitive polyimide for via formation and electrolytic plating to define wiring and terminal metal Levels. One plane pair of thin films was constructed on Corning glass 7059 panels for 35 micron Lines on 85 micron pitch. In addition, two metal - dielectric Levels with 13 um lines on 25 um pitch has also been demonstrated. The 25 um pitch represents the most aggressive groundrule practiced in electronic packaging today. The successful production of electrically good substrates at a high yield from a 300 mm panel provides a gateway to significant cost reductions of future MCM-D products from IBM. In this paper we will discuss the processes and equipment used to fabricate two different test vehicles, as welt as some of cost and yield considerations associated with Large area panel processing for MCM-D packages.","PeriodicalId":363745,"journal":{"name":"Proceedings of the International Conference on Multichip Modules","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-04-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Large Format Fabrication a Practical Approach to Low Cost MCM-D\",\"authors\":\"G. White, E. Perfecto, T. Demercurio, D. Mcherron, T. Redmond, M. Norcott\",\"doi\":\"10.1109/ICMCM.1994.753534\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The IBM Microelectronics Division at East Fishkill has recently demonstrated the fabrication of thin films for MCM-D on large area panels, 300 mm x 300 mm in size. Fabrication of the thin films was accomplished on IBM's 300 mm development Line using immersion development of photosensitive polyimide for via formation and electrolytic plating to define wiring and terminal metal Levels. One plane pair of thin films was constructed on Corning glass 7059 panels for 35 micron Lines on 85 micron pitch. In addition, two metal - dielectric Levels with 13 um lines on 25 um pitch has also been demonstrated. The 25 um pitch represents the most aggressive groundrule practiced in electronic packaging today. The successful production of electrically good substrates at a high yield from a 300 mm panel provides a gateway to significant cost reductions of future MCM-D products from IBM. In this paper we will discuss the processes and equipment used to fabricate two different test vehicles, as welt as some of cost and yield considerations associated with Large area panel processing for MCM-D packages.\",\"PeriodicalId\":363745,\"journal\":{\"name\":\"Proceedings of the International Conference on Multichip Modules\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-04-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the International Conference on Multichip Modules\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMCM.1994.753534\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the International Conference on Multichip Modules","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMCM.1994.753534","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
摘要
位于East Fishkill的IBM微电子部门最近展示了在300 mm x 300 mm尺寸的大面积面板上制造MCM-D薄膜。薄膜的制造是在IBM的300mm显影线上完成的,使用光敏聚酰亚胺的浸没显影,用于通孔形成和电解电镀,以定义布线和终端金属水平。在康宁7059玻璃面板上构建了一对平面薄膜,用于85微米间距的35微米线。此外,还证明了在25um间距上具有13um线的两个金属介电电平。25微米的间距代表了当今电子封装中最具侵略性的接地规则。从300毫米面板上成功生产出高成品率的良好电基板,为IBM未来MCM-D产品的显着降低成本提供了一个途径。在本文中,我们将讨论用于制造两种不同测试车辆的工艺和设备,以及与MCM-D封装的大面积面板加工相关的一些成本和良率考虑因素。
Large Format Fabrication a Practical Approach to Low Cost MCM-D
The IBM Microelectronics Division at East Fishkill has recently demonstrated the fabrication of thin films for MCM-D on large area panels, 300 mm x 300 mm in size. Fabrication of the thin films was accomplished on IBM's 300 mm development Line using immersion development of photosensitive polyimide for via formation and electrolytic plating to define wiring and terminal metal Levels. One plane pair of thin films was constructed on Corning glass 7059 panels for 35 micron Lines on 85 micron pitch. In addition, two metal - dielectric Levels with 13 um lines on 25 um pitch has also been demonstrated. The 25 um pitch represents the most aggressive groundrule practiced in electronic packaging today. The successful production of electrically good substrates at a high yield from a 300 mm panel provides a gateway to significant cost reductions of future MCM-D products from IBM. In this paper we will discuss the processes and equipment used to fabricate two different test vehicles, as welt as some of cost and yield considerations associated with Large area panel processing for MCM-D packages.