斜面/多向UV光刻负色调厚光刻胶三维轮廓模拟器

Zhen Zhu, Qing‐An Huang, Wei-Hua Li, Zaifa Zhou
{"title":"斜面/多向UV光刻负色调厚光刻胶三维轮廓模拟器","authors":"Zhen Zhu, Qing‐An Huang, Wei-Hua Li, Zaifa Zhou","doi":"10.1109/ICSENS.2009.5398530","DOIUrl":null,"url":null,"abstract":"A three-dimensional (3D) profile simulator that integrates aerial image module, exposure module, post-exposure bake (PEB) module and development module is presented in this paper for the inclined/multi-directional ultraviolet (UV) lithography of negative thick photoresist such as SU-8. Based on the scalar diffraction theory, the improved paraxial approximation and Fresnel approximation solutions are developed to simulate the inclined UV light intensity distribution into photoresist with the refraction, the absorption of SU-8 and the reflection at substrate surface incorporated effectively. A 3D dynamic cellular automate method for photoresist etching simulation is improved to calculate the final development patterns efficiently and accurately. The 3D profiles of oblique developed photoresist with or without reflection-induced structures as well as multi-directional-exposure structures are successfully predicted by this simulator, which demonstrate good agreement with the experimental results.","PeriodicalId":262591,"journal":{"name":"2009 IEEE Sensors","volume":"77 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"A 3D profile simulator for inclined/multi-directional UV lithography process of negative-tone thick photoresists\",\"authors\":\"Zhen Zhu, Qing‐An Huang, Wei-Hua Li, Zaifa Zhou\",\"doi\":\"10.1109/ICSENS.2009.5398530\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A three-dimensional (3D) profile simulator that integrates aerial image module, exposure module, post-exposure bake (PEB) module and development module is presented in this paper for the inclined/multi-directional ultraviolet (UV) lithography of negative thick photoresist such as SU-8. Based on the scalar diffraction theory, the improved paraxial approximation and Fresnel approximation solutions are developed to simulate the inclined UV light intensity distribution into photoresist with the refraction, the absorption of SU-8 and the reflection at substrate surface incorporated effectively. A 3D dynamic cellular automate method for photoresist etching simulation is improved to calculate the final development patterns efficiently and accurately. The 3D profiles of oblique developed photoresist with or without reflection-induced structures as well as multi-directional-exposure structures are successfully predicted by this simulator, which demonstrate good agreement with the experimental results.\",\"PeriodicalId\":262591,\"journal\":{\"name\":\"2009 IEEE Sensors\",\"volume\":\"77 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 IEEE Sensors\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSENS.2009.5398530\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE Sensors","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSENS.2009.5398530","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

针对SU-8等负厚光刻胶的倾斜/多向紫外光刻,设计了一种集航空成像模块、曝光模块、曝光后烘烤模块和显影模块于一体的三维轮廓模拟器。基于标量衍射理论,提出了改进的近轴近似解和菲涅耳近似解,有效地模拟了SU-8的折射、吸收和基片表面反射在光刻胶中的倾斜UV光强分布。改进了光刻胶蚀刻模拟的三维动态元胞自动化方法,以高效准确地计算出最终的显影图案。利用该仿真器成功地预测了斜显影光刻胶的三维轮廓,结果与实验结果吻合较好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A 3D profile simulator for inclined/multi-directional UV lithography process of negative-tone thick photoresists
A three-dimensional (3D) profile simulator that integrates aerial image module, exposure module, post-exposure bake (PEB) module and development module is presented in this paper for the inclined/multi-directional ultraviolet (UV) lithography of negative thick photoresist such as SU-8. Based on the scalar diffraction theory, the improved paraxial approximation and Fresnel approximation solutions are developed to simulate the inclined UV light intensity distribution into photoresist with the refraction, the absorption of SU-8 and the reflection at substrate surface incorporated effectively. A 3D dynamic cellular automate method for photoresist etching simulation is improved to calculate the final development patterns efficiently and accurately. The 3D profiles of oblique developed photoresist with or without reflection-induced structures as well as multi-directional-exposure structures are successfully predicted by this simulator, which demonstrate good agreement with the experimental results.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信