{"title":"CMOS兼容MEMS电容式声传感器工艺优化","authors":"Ming Li, Xiaoxu Kang, Xiaolan Zhong","doi":"10.1109/ASICON52560.2021.9620398","DOIUrl":null,"url":null,"abstract":"CMOS compatible MEMS capacitive acoustic sensor was designed, developed and optimized on 150mm CMOS Line. Standard LPCVD was used to develop low stress poly film for back-plate and membrane structure. Reflow process was used to solve the problem induced by high step height. Stop structure was used to avoid stiction problem during releasing process. Additional implant process was used to achieve substrate ohmic contact. And after integration process optimization, good physical profile, electrical performance and yield can be obtained which can match the sensor requirements.","PeriodicalId":233584,"journal":{"name":"2021 IEEE 14th International Conference on ASIC (ASICON)","volume":"C-32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Process Optimization for CMOS Compatible MEMS Capacitive Acoustic Sensor\",\"authors\":\"Ming Li, Xiaoxu Kang, Xiaolan Zhong\",\"doi\":\"10.1109/ASICON52560.2021.9620398\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"CMOS compatible MEMS capacitive acoustic sensor was designed, developed and optimized on 150mm CMOS Line. Standard LPCVD was used to develop low stress poly film for back-plate and membrane structure. Reflow process was used to solve the problem induced by high step height. Stop structure was used to avoid stiction problem during releasing process. Additional implant process was used to achieve substrate ohmic contact. And after integration process optimization, good physical profile, electrical performance and yield can be obtained which can match the sensor requirements.\",\"PeriodicalId\":233584,\"journal\":{\"name\":\"2021 IEEE 14th International Conference on ASIC (ASICON)\",\"volume\":\"C-32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE 14th International Conference on ASIC (ASICON)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASICON52560.2021.9620398\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 14th International Conference on ASIC (ASICON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASICON52560.2021.9620398","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Process Optimization for CMOS Compatible MEMS Capacitive Acoustic Sensor
CMOS compatible MEMS capacitive acoustic sensor was designed, developed and optimized on 150mm CMOS Line. Standard LPCVD was used to develop low stress poly film for back-plate and membrane structure. Reflow process was used to solve the problem induced by high step height. Stop structure was used to avoid stiction problem during releasing process. Additional implant process was used to achieve substrate ohmic contact. And after integration process optimization, good physical profile, electrical performance and yield can be obtained which can match the sensor requirements.