CMOS兼容MEMS电容式声传感器工艺优化

Ming Li, Xiaoxu Kang, Xiaolan Zhong
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引用次数: 1

摘要

在150mm CMOS线上设计、开发并优化了兼容CMOS的MEMS电容式声传感器。采用标准LPCVD制备了用于背板和膜结构的低应力聚膜。采用回流工艺解决了台阶高度过高的问题。采用止动结构,避免了释放过程中的粘滞问题。采用附加植入工艺实现衬底欧姆接触。经过集成工艺优化,可获得符合传感器要求的良好物理外形、电性能和良率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Process Optimization for CMOS Compatible MEMS Capacitive Acoustic Sensor
CMOS compatible MEMS capacitive acoustic sensor was designed, developed and optimized on 150mm CMOS Line. Standard LPCVD was used to develop low stress poly film for back-plate and membrane structure. Reflow process was used to solve the problem induced by high step height. Stop structure was used to avoid stiction problem during releasing process. Additional implant process was used to achieve substrate ohmic contact. And after integration process optimization, good physical profile, electrical performance and yield can be obtained which can match the sensor requirements.
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