NCHIPSIM - NMOS芯片性能指标的微电脑模拟器

Ashok K. Goel, F. Schuermeyer
{"title":"NCHIPSIM - NMOS芯片性能指标的微电脑模拟器","authors":"Ashok K. Goel, F. Schuermeyer","doi":"10.1109/GLSV.1991.143990","DOIUrl":null,"url":null,"abstract":"The authors have developed a computer simulator called 'NCHIPSIM' which can be used to simulate with a microcomputer the performance indicators of an integrated circuit microprocessor chip based on silicon NMOS technology. In addition to predicting the various chip performance indicators such as its size, power consumption, maximum clock frequency, computational capacity, functional throughput and the fabrication yield for a chip with given technology parameters, the simulator can also be used to simulate the dependence of any of the performance indicators based on the technology feature size as well as on the integration level of the chip.<<ETX>>","PeriodicalId":261873,"journal":{"name":"[1991] Proceedings. First Great Lakes Symposium on VLSI","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"'NCHIPSIM'-a microcomputer simulator of NMOS chip performance indicators\",\"authors\":\"Ashok K. Goel, F. Schuermeyer\",\"doi\":\"10.1109/GLSV.1991.143990\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors have developed a computer simulator called 'NCHIPSIM' which can be used to simulate with a microcomputer the performance indicators of an integrated circuit microprocessor chip based on silicon NMOS technology. In addition to predicting the various chip performance indicators such as its size, power consumption, maximum clock frequency, computational capacity, functional throughput and the fabrication yield for a chip with given technology parameters, the simulator can also be used to simulate the dependence of any of the performance indicators based on the technology feature size as well as on the integration level of the chip.<<ETX>>\",\"PeriodicalId\":261873,\"journal\":{\"name\":\"[1991] Proceedings. First Great Lakes Symposium on VLSI\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1991] Proceedings. First Great Lakes Symposium on VLSI\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/GLSV.1991.143990\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991] Proceedings. First Great Lakes Symposium on VLSI","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GLSV.1991.143990","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

作者开发了一种计算机模拟器“NCHIPSIM”,该模拟器可用于在微型计算机上模拟基于硅NMOS技术的集成电路微处理器芯片的性能指标。除了预测各种芯片性能指标,如其尺寸、功耗、最大时钟频率、计算能力、功能吞吐量和给定技术参数的芯片的制造成品率外,模拟器还可用于模拟基于技术特征尺寸以及芯片集成水平的任何性能指标的依赖关系。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
'NCHIPSIM'-a microcomputer simulator of NMOS chip performance indicators
The authors have developed a computer simulator called 'NCHIPSIM' which can be used to simulate with a microcomputer the performance indicators of an integrated circuit microprocessor chip based on silicon NMOS technology. In addition to predicting the various chip performance indicators such as its size, power consumption, maximum clock frequency, computational capacity, functional throughput and the fabrication yield for a chip with given technology parameters, the simulator can also be used to simulate the dependence of any of the performance indicators based on the technology feature size as well as on the integration level of the chip.<>
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