{"title":"允许大电源波动的IC缓冲器的宏观模型","authors":"I. Stievano, C. Siviero, I. Maio, F. Canavero","doi":"10.1109/EPEP.2007.4387199","DOIUrl":null,"url":null,"abstract":"This paper addresses the generation of enhanced behavioral models for digital IC buffers. The proposed models can reproduce the behavior of real devices also for large fluctuations of the power supply voltage. The models can be easily estimated from port transient responses and can be effectively implemented in any commercial tool as SPICE subcircuits or VHDL-AMS descriptions.","PeriodicalId":402571,"journal":{"name":"2007 IEEE Electrical Performance of Electronic Packaging","volume":"89 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Macromodels of IC Buffers Allowing for Large Power Supply Fluctuations\",\"authors\":\"I. Stievano, C. Siviero, I. Maio, F. Canavero\",\"doi\":\"10.1109/EPEP.2007.4387199\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper addresses the generation of enhanced behavioral models for digital IC buffers. The proposed models can reproduce the behavior of real devices also for large fluctuations of the power supply voltage. The models can be easily estimated from port transient responses and can be effectively implemented in any commercial tool as SPICE subcircuits or VHDL-AMS descriptions.\",\"PeriodicalId\":402571,\"journal\":{\"name\":\"2007 IEEE Electrical Performance of Electronic Packaging\",\"volume\":\"89 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-11-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE Electrical Performance of Electronic Packaging\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.2007.4387199\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Electrical Performance of Electronic Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2007.4387199","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Macromodels of IC Buffers Allowing for Large Power Supply Fluctuations
This paper addresses the generation of enhanced behavioral models for digital IC buffers. The proposed models can reproduce the behavior of real devices also for large fluctuations of the power supply voltage. The models can be easily estimated from port transient responses and can be effectively implemented in any commercial tool as SPICE subcircuits or VHDL-AMS descriptions.