允许大电源波动的IC缓冲器的宏观模型

I. Stievano, C. Siviero, I. Maio, F. Canavero
{"title":"允许大电源波动的IC缓冲器的宏观模型","authors":"I. Stievano, C. Siviero, I. Maio, F. Canavero","doi":"10.1109/EPEP.2007.4387199","DOIUrl":null,"url":null,"abstract":"This paper addresses the generation of enhanced behavioral models for digital IC buffers. The proposed models can reproduce the behavior of real devices also for large fluctuations of the power supply voltage. The models can be easily estimated from port transient responses and can be effectively implemented in any commercial tool as SPICE subcircuits or VHDL-AMS descriptions.","PeriodicalId":402571,"journal":{"name":"2007 IEEE Electrical Performance of Electronic Packaging","volume":"89 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Macromodels of IC Buffers Allowing for Large Power Supply Fluctuations\",\"authors\":\"I. Stievano, C. Siviero, I. Maio, F. Canavero\",\"doi\":\"10.1109/EPEP.2007.4387199\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper addresses the generation of enhanced behavioral models for digital IC buffers. The proposed models can reproduce the behavior of real devices also for large fluctuations of the power supply voltage. The models can be easily estimated from port transient responses and can be effectively implemented in any commercial tool as SPICE subcircuits or VHDL-AMS descriptions.\",\"PeriodicalId\":402571,\"journal\":{\"name\":\"2007 IEEE Electrical Performance of Electronic Packaging\",\"volume\":\"89 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-11-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE Electrical Performance of Electronic Packaging\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.2007.4387199\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Electrical Performance of Electronic Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2007.4387199","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

本文讨论了数字集成电路缓冲器增强行为模型的生成。所提出的模型也能在电源电压波动较大的情况下再现实际器件的行为。该模型可以很容易地从端口瞬态响应中估计,并且可以有效地在任何商业工具中实现,如SPICE子电路或VHDL-AMS描述。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Macromodels of IC Buffers Allowing for Large Power Supply Fluctuations
This paper addresses the generation of enhanced behavioral models for digital IC buffers. The proposed models can reproduce the behavior of real devices also for large fluctuations of the power supply voltage. The models can be easily estimated from port transient responses and can be effectively implemented in any commercial tool as SPICE subcircuits or VHDL-AMS descriptions.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信